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基于IEEE1149.4的差分测试方法的研究与应用
引用本文:雷加,尹爱晖.基于IEEE1149.4的差分测试方法的研究与应用[J].计算机测量与控制,2005,13(8):766-768.
作者姓名:雷加  尹爱晖
作者单位:桂林电子工业学院,电子工程系,广西,桂林,541004
摘    要:IEEE1149.4标准(DOT4)为解决数模混合电路的边界扫描测试提供了有效的方法,对于数模混合差分电路的互联测试,一直是数模混合电路中巨联测试的重点之一,介绍了一种基于此标准的差分互联电路的测试方法以及差分模拟边界扫描单元的应用,对混合差分电路实现了简荤互联和扩展互联的边界扫描测试,从而提高了差分电路互联测试的能力。

关 键 词:边界扫描  IEEE1149.4  差分测试  数模混合电路
文章编号:1671-4598(2005)08-0766-02
修稿时间:2004年10月26

Research and Application of Differential Testing Method Based on IEEE1149.4
Lei Jia,Yin Aihui.Research and Application of Differential Testing Method Based on IEEE1149.4[J].Computer Measurement & Control,2005,13(8):766-768.
Authors:Lei Jia  Yin Aihui
Abstract:IEEE1149.4 infrastructure has been aimed primarily for the boundary scan test of the mixed-signal circuits. For the differential testing, it is very important in the mixed-signal test. There is a method for testing differential connection circuit and the application of ABM (analog boundary module), which conform this standard completely. It realizes the boundary scan differential testing for the mixed-signal circuits, so as to enhance the test capability for the differential circuit.
Keywords:boundary scan test  IEEE1149  4  differential testing  mixed-signal circuit
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