| 有效消减测试成本的并行技术分析 |
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| 引用本文： | 王敏,张虹,闫鹏.有效消减测试成本的并行技术分析[J].计算机与数字工程,2010,38(9):13-15,27. |
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| 作者姓名： | 王敏 张虹 闫鹏 |
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| 作者单位： | 1. 中国航天科工集团第二研究院二〇一所,北京,100854
2. 北京大学微电子学研究院SOC测试中心,北京,100084 |
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| 摘 要： | 文章通过定量分析指出,并行测试不仅降低了ATE系统的设备投资,而且能够消减测试环节中各项成本因素,因而比之低成本ATE,是更为显著、有效的测试成本消减方法。文章还指出,并行测试最佳站点数相对独立于ATE设备成本、运行成本、产品的合格率以及其它多种限制因素,若设备中可用的独立资源有限,就会降低测试的并行度,从而导致部分测试顺序执行,并行测试的成本优势将迅速消失。
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| 关 键 词： | 测试成本 低成本ATE 并行测试 |
Parallel Technique Analysis for Effective Reducing Test Cost |
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| Wang Min,Zhang Hong,Yan Peng.Parallel Technique Analysis for Effective Reducing Test Cost[J].Computer and Digital Engineering,2010,38(9):13-15,27. |
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| Authors: | Wang Min Zhang Hong Yan Peng |
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| Affiliation: | Wang Min Zhang Hong Yan Peng (The Second Academy of China Aerospace Science and Industry Corporation 201 Institute , Beijing 100854) (Institute of Microelectronics of Peking University Soc Testing Center , Beijing 100084) |
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| Abstract: | Through a quantitive analysis, this paper points out that parallel test not only reduces the system investment for ATE, but also costs down those crucial factors in the every test procedure. Compared with Low-cost ATE, parallel test provides more significant and more effective way to reduce test cost. In addition, ATE cost,operation cost. yield and other relative factors have no influence on the best number of sites in parallel test. While, with the limit of independent resources, the multi site efficiency will decline, leading to apply sequential test in certain parts, which means to advantage of parallel test in cost soon disappeared. |
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| Keywords: | test cost low cost ATE parallel test |
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