Network and device-level impacts: performance and reliability of active I/O storage systems |
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| Authors: | Steve C Chiu Alok N Choudhary Danli Wang |
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| Affiliation: | (1) CS Program, College of Engineering, Idaho State University, Pocatello, ID 83209, USA;(2) EECS Department, Northwestern University, Evanston, IL 60208, USA;(3) IEL, Institute of Software, Chinese Academy of Sciences, Beijing, 100080, People’s Republic of China |
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| Abstract: | Distributed active storage architectures are designed to offload user-level processing to the peripheral from the host servers.
In this paper, we report preliminary investigation on performance and fault recovery designs, as impacted by emerging storage
interconnect protocols and state-of-the-art storage devices. Empirical results obtained using validated device-level and interconnect
data demonstrate the significance of the said parameters on the overall system performance and reliability. |
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| Keywords: | Parallel I/O Distributed storage MEMS Performance analysis InfiniBand |
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