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一种通用高精度存储式冲击波测试系统设计
引用本文:刘泽鹏,苏新彦,王小亮,赵飞飞,王鹏程.一种通用高精度存储式冲击波测试系统设计[J].单片机与嵌入式系统应用,2021,21(1):54-56,75.
作者姓名:刘泽鹏  苏新彦  王小亮  赵飞飞  王鹏程
作者单位:中北大学信息探测与处理山西省重点试验室,太原030051;中北大学信息探测与处理山西省重点试验室,太原030051;中北大学信息探测与处理山西省重点试验室,太原030051;中北大学信息探测与处理山西省重点试验室,太原030051;中北大学信息探测与处理山西省重点试验室,太原030051
摘    要:针对现有冲击波测试系统精度不足及爆炸测试后易损坏的问题,设计了一种通用式高精度存储式冲击波测试系统。首先,该系统以通用、模块化的总体设计思想,在此基础上把操作面板、传感器、采集电路、存储电路集成一体。测试系统以FPGA为主控芯片,采用ICP型压力传感器,将采集到的信号通过高精度A/D转换器进行数/模转换,并存储在NAND Flash中,待爆炸结束后将数据进行回读。最后通过减小系统体积,降低测试系统被破片击中的概率。多次试验结果表明,该系统在军工领域有较高的工程应用价值。

关 键 词:NAND  Flash  存储测试  冲击波  FPGA

Design of Universal High Precision Memory Shock Wave Test System
Liu Zepeng,Su Xinyan,Wang Xiaoliang,Zhao Feifei,Wang Pengcheng.Design of Universal High Precision Memory Shock Wave Test System[J].Microcontrollers & Embedded Systems,2021,21(1):54-56,75.
Authors:Liu Zepeng  Su Xinyan  Wang Xiaoliang  Zhao Feifei  Wang Pengcheng
Affiliation:(Shanxi Provice Key Laboratory of Information Detection and Processing,North University of China,Taiyuan 030051,China)
Abstract:Aiming at the lack of accuracy of the existing shock wave testing system and the problem of easy damage after explosion test,a universal high precision memory shock wave testing system is designed.Firstly,the system integrates the operation panel,sensor,acquisition circuit and storage circuit on the basis of general and modular design idea.The test system takes FPGA as the main control chip and uses ICP pressure sensor.The collected signals are converted from digital to analog through high-precision A/D and stored in NAND Flash.The data will be read back after the explosion.Finally,by reducing the volume of the system,the probability of the test system being hit by the fragments is reduced.The experiment results show that the system has high engineering application value in military industry.
Keywords:NAND Flash  stored test  blast wave  FPGA
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