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基于DS2172和DS21554的误码测试仪设计
引用本文:杨海涛,纪海林.基于DS2172和DS21554的误码测试仪设计[J].自动化仪表,2007,28(10):18-20.
作者姓名:杨海涛  纪海林
作者单位:总参谋部第63研究所,南京,210007
摘    要:介绍了一种采用误码专用测试芯片DS2172和E1接口芯片DS21554的误码测试仪的设计方案。该误码测试仪可以完成2048 kbps速率及一些较低速率的误码测试,提供E1接口及TTL接口两种模式,同时提供伪随机码和人工码两种测试码型,详细介绍了具体的硬件电路设计和具体的软件设计。设计结果表明该误码仪可以完成误码测试、误码统计及误码率的计算,能够满足数字传输系统常见故障的检测需求。

关 键 词:误码测试仪  E1接口  随机间隔  芯片  图形化

Design of Bit-error-rate Tester Based on DS2172 and DS21554
Yang Haitao,Ji Hailin.Design of Bit-error-rate Tester Based on DS2172 and DS21554[J].Process Automation Instrumentation,2007,28(10):18-20.
Authors:Yang Haitao  Ji Hailin
Abstract:The design scheme of a bit-errer-rate tester based on the dedicated error rate testing chip DS2172 and E1 interface chip DS21554 is presented. The tester is suitable for error rate tests for data stream of rates below 2 048 kbps. Two of the interfacing modes are available ,E1 and TTL; and two of the test patterns are provided ,pseudorandom and artificial pattern. The design of specific hardware circuits and software is introduced in detail. The result indicates that the BERT can test the bit error,count the error,calculate the error rates,and meet the requirement of detecting common faults in digital transmission system.
Keywords:
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