| 基于TI MSP430F169的磁性材料磁滞特性的测量方法 |
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| 引用本文： | 颜幸尧,胡美君,阮健.基于TI MSP430F169的磁性材料磁滞特性的测量方法[J].自动化仪表,2005,26(9):17-20. |
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| 作者姓名： | 颜幸尧 胡美君 阮健 |
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| 作者单位： | 浙江工业大学机电工程学院,杭州,310014 |
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| 摘 要： | 对磁性材料磁滞特性参数的测量原理做了简单的介绍,针对目前一般磁滞特性测量仪的缺点,提出了基于TI MSP430F169系统芯片实现磁滞特性测量的新方法及其具体实现方案。实验结果表明,该方法大大地改善了仪器的性能。
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| 关 键 词： | 磁滞特性 TI MSP430F169 磁性材料 |
| 收稿时间： | 03 15 2005 12:00AM |
| 修稿时间： | 2005年3月15日 |
The Measuring Method Based on TI MSP430F169 for Hysteresis Characteristic of Magnetic Materials |
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| Yan Xingyao,Hu Meijun,RUAN Jian.The Measuring Method Based on TI MSP430F169 for Hysteresis Characteristic of Magnetic Materials[J].Process Automation Instrumentation,2005,26(9):17-20. |
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| Authors: | Yan Xingyao Hu Meijun RUAN Jian |
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| Affiliation: | Yan Xingyao Hu Meijun Ruan Jian |
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| Abstract: | The measuring principle of hysteresis characteristic of magnetic materials is presented briefly. To against the demerits of common measuring instruments in this area, the new method and concrete implementing strategy of measuring hysteresis characteristic by using TI MSP430F169 MCU is proposed. The result of experiments shows that this method greatly improved the performance of instrument. |
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| Keywords: | Hysteresis characteristic TI MSP430F169 Magnetic material |
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