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基于单片机的数字微加速度计静态测试平台设计
引用本文:李振波,李疆,刘北英.基于单片机的数字微加速度计静态测试平台设计[J].传感器与微系统,2009,28(2):87-90.
作者姓名:李振波  李疆  刘北英
作者单位:北京科技大学,机械工程学院,北京,100083
摘    要:设计了一种新型的PWM数字微加速度计自动测试平台。该技术基于AT89S52单片机,适用于重力场条件下PWM数字输出的加速度计的快速测试。系统脱离了计算机的辅助计算和控制,利用单片机自动控制测试过程,并独立完成数据的拟合计算,极大地简化了测试系统,并利用此平台完成了ADXL202E数字加速度计静态模型的辨识任务,标定了加速度计的标度因数和零偏2个重要的性能指标。该测试平台测试精度优于2mgn。

关 键 词:单片机  数字微加速度计  静态模型辨识

Design of measuring platform for static performances of digital micro-accelerometers based on single-chip microcontroller
LI Zhen-bo,LI Jiang,LIU Bei-ying.Design of measuring platform for static performances of digital micro-accelerometers based on single-chip microcontroller[J].Transducer and Microsystem Technology,2009,28(2):87-90.
Authors:LI Zhen-bo  LI Jiang  LIU Bei-ying
Affiliation:( School of Mechanical Engineering, University of Science and Technology Beijing, Beijing 100083, China)
Abstract:A new automatic test platform for micro-accelerometers with PWM digital output is designed.The platform,based on an AT89S52 single-chip microcontroller,is able to perform fast test of PWM output micro-accelerometers at gravitational field.This platform carries out automatic control and test only with a single-chip,and completes relative calculation alone without computer's aid.It simplifies the test system considerably,and accomplishes identification of the static model for ADXL202E,a PWM output digital micro-accelerometer.And two important parameters,scale factor and bias instability,can be derived from the model.The precision of the platform is above 2 mgn.
Keywords:single-chip microcontroller  digital micro-accelerometer  static model identification
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