Mutation-oriented test data augmentation for GUI software fault localization |
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| Affiliation: | 1. Computer Science Department, Fahad Bin Sultan University, P.O. Box 15700, Tabuk 71454, Saudi Arabia;2. Département d’informatique et de la recherche operationnelle, Université de Montréal, Pavillon André-Aisenstadt, CP 6128 succ Centre-Ville, Montréal, QC H3C 3J7, Canada;3. Centre de recherche informatique de Montréal, 405 Avenue Ogilvy, #101, Montréal, QC H3N 1M3, Canada;1. Department of Computer Science & Engineering, Pusan National University, Busan, South Korea;2. Department of Computer Science, Iowa State University, IA, USA;1. Assistant Professor, Department of Dentistry, Catholic University of Daegu School of Medicine; and Graduate Student, Department of Prosthodontics, School of Dentistry, Kyungpook National University, Daegu, South Korea;2. Assistant Professor, Department of Dentistry, Catholic University of Daegu School of Medicine, Daegu, South Korea;3. Professor, Department of Dentistry, Catholic University of Daegu School of Medicine, Daegu, South Korea;1. Electronics, Instrumentation and Radiological Safety Group, Indira Gandhi Centre for Atomic Research, Kalpakkam, India;2. Reactor Design Group, Indira Gandhi Centre for Atomic Research, Kalpakkam, India;1. Resident, Division of Orthodontics, College of Dentistry, Ohio State University, Columbus, Ohio;2. Graduate research associate, Division of Biosciences, College of Dentistry, Ohio State University, Columbus, Ohio;3. Assistant professor, Division of Biosciences, College of Dentistry, Ohio State University, Columbus, Ohio;4. Professor, Division of Orthodontics, College of Dentistry, Ohio State University, Columbus, Ohio;5. Associate professor, Division of Orthodontics, College of Dentistry, Ohio State University, Columbus, Ohio;1. Department of Physics and Astronomy & Center for Computational Science, Middle Tennessee State University, United States;2. School of Physics, Astronomy, and Computational Science, George Mason University, United States |
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| Abstract: | ContextFault localization lies at the heart of program debugging and often proceeds by contrasting the statistics of program constructs executed by passing and failing test cases. A vital issue here is how to obtain these “suitable” test cases. Techniques presented in the literature mostly assume the existence of a large test suite a priori. However, developers often encounter situations where a failure occurs, but where no or no appropriate test suite is available for use to localize the fault.ObjectiveThis paper aims to alleviate this key limitation of traditional fault localization techniques for GUI software particularly, namely, it aims at enabling cost-effective fault localization process for GUI software in the described scenario.MethodTo address this scenario, we propose a mutation-oriented test data augmentation technique, which actually is directed by the “similarity” criterion in GUI software’s test case context towards the generation of test suite with excellent fault localization capabilities. More specifically, the technique mainly uses four proposed novel mutation operators to iteratively mutate some failing GUI test cases’ event sequences to derive new test cases potentially useful to localize the specific encountered fault. We then compare the fault localization performance of the test suite generated using this technique with that of an original provided large event-pair adequate test suite on some GUI applications.ResultsThe results indicate that the proposed technique is capable of generating a test suite that has comparable, if not better, fault localization effectiveness to the event-pair adequate test suite, but it is much smaller and it is generated immediately once a failure is encountered by developers.ConclusionIt is concluded that the proposed technique can truly enable quick-start cost-effective fault localization process under the investigated all-too-common scenario, greatly alleviating one key limitation of traditional fault localization techniques and prompting the test–diagnose–repair cycle. |
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| Keywords: | Fault localization GUI software Mutation operator Test data augmentation |
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