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基于程序频谱的缺陷定位方法
引用本文:蔡蕊,张仕,余晓菲,蒋建民.基于程序频谱的缺陷定位方法[J].计算机系统应用,2019,28(1):188-193.
作者姓名:蔡蕊  张仕  余晓菲  蒋建民
作者单位:福建师范大学数学与信息学院,福建,350117;福建师范大学数学与信息学院,福建350117;福建师范大学数字福建环境监测物联网实验室,福建350117
基金项目:国家自然科学基金(61772004);上海可信计算重点实验室开放课题(07dz22304201401);福建省自然科学基金(2018J01777)
摘    要:软件测试是生产可靠软件的重要保障,对测试所发现缺陷的解决可以分为缺陷定位和缺陷修改两个步骤1],其中的缺陷定位是最耗时的.通常情况下,测试套件中成功执行的测试用例都占绝大多数,对基于程序频谱的缺陷定位方法,应该具备自主调节成功测试用例覆盖比重的能力,以提高方法的可用性.即,随着语句被成功测试用例覆盖的次数增多,该语句的覆盖次数对怀疑率的贡献度应逐渐减小,成功测试用例数的有效处理能提高缺陷定位方法的效果.基于此,本文提出EPStarEP*)缺陷定位方法,该方法可以有效调整成功执行用例数的影响,以避免成功用例数量对缺陷定位效果的过度影响,从而提高缺陷定位的准确性,通过实验对比,说明了EP*方法比现有的几种缺陷定位方法具有更高的缺陷定位精度.

关 键 词:EP*方法  缺陷定位  程序频谱  测试用例  定位效果
收稿时间:2018/5/22 0:00:00
修稿时间:2018/6/19 0:00:00

Defect Localization Method Based on Program Spectrum
CAI Rui,ZHANG Shi,YU Xiao-Fei and JIANG Jian-Min.Defect Localization Method Based on Program Spectrum[J].Computer Systems& Applications,2019,28(1):188-193.
Authors:CAI Rui  ZHANG Shi  YU Xiao-Fei and JIANG Jian-Min
Affiliation:School of Mathematics and Informatics, Fujian Normal University, Fujian 350117, China,School of Mathematics and Informatics, Fujian Normal University, Fujian 350117, China;Digital Fujian Environmental Monitoring Network Laboratory, Fujian Normal University, Fujian 350117, China,School of Mathematics and Informatics, Fujian Normal University, Fujian 350117, China and School of Mathematics and Informatics, Fujian Normal University, Fujian 350117, China;Digital Fujian Environmental Monitoring Network Laboratory, Fujian Normal University, Fujian 350117, China
Abstract:Software testing plays a vital role in producing reliable software. The debugging of software is divided into two steps:fault localization and fault modification, where the fault localization is the most time-consuming and tedious work. Generally, most of test cases in a test suite performed successfully. In order to improve the availability of the defect location method based on the program spectrum, the method should have the ability to adjust the weight of successful coverage automatically. That is, if the contribution of the number of statements to the suspiciousness is reduced gradually with the increase of the number of successful test cases, the effectiveness of fault localization method can be improved greatly. Based on this idea, this study proposes an EPStar (EP*) defect location method, which can effectively adjust the effect of successful use cases, so as to avoid the excessive influence of the number of successful use cases to the defect location effect. To improve the accuracy of error location, the experimental comparison shows that EP* method has higher defect location accuracy than several existing defect location methods.
Keywords:EP* method  defect localization  program spectrum  test case  location effect
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