| Test Derivation Through Critical Path Transitions |
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| 作者姓名： | Li Weidong Wei Daozheng |
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| 作者单位： | [1]CADLaboratory,InstituteofComputingTechnology,AcademiaSinica,Beijing100080 [2]CADLaboratory,InstituteofCo |
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| 摘 要： | In this paper, a new technique called test derivation is presented,aiming at the promotion of the random testing efficiency for combinational circuits,Combined with a fault simulator based on critical path tracing method,we introduce the concept of seed test derivation and attempt to generate a group of new tests from the seed test by means of critical path transition.The neccessary conditions and efficient algorithms are proposed to guarantee the usefulness of the newly derived tests and the correctness of the critical path transitions.Also,examples are given to demonstrate the effectiveness of the technique.
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| 关 键 词： | 随机测试 CAD 试探推导 临界路径变换 |
Test derivation through critical path transitions |
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| Li Weidong,Wei Daozheng.Test Derivation Through Critical Path Transitions[J].Journal of Computer Science and Technology,1992,7(1):12-18. |
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| Authors: | Weidong Li Daozheng Wei |
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| Affiliation: | CAD Laboratory Institute of Computing Technology; Academia Sinica; Beijing; CAD Laboratory; Institute of Computing Technology; |
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| Abstract: | In this paper, a new technique called test derivation is presented, aiming at the promotion of the random testing efficiency
for combinational circuits. Combined with a fault simulator based on critical path tracing method, we introduce the concept
of seed test derivation and attempt to generate a group of new tests from the seed test by means of critical path transition.
The necessary conditions and efficient algorithms are proposed to guarantee the usefulness of the newly derived tests and
the correctness of the critical path transitions. Also, examples are given to demonstrate the effectiveness of the technique. |
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| Keywords: | |
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