首页 | 本学科首页   官方微博 | 高级检索  
     


Imaging of Cell‐to‐Material Interfaces by SEM after in situ Focused Ion Beam Milling on Flat Surfaces and Complex 3D‐Fibrous Structures
Authors:Anne Greet Bittermann  Claus Burkhardt  Heike Hall
Affiliation:1. ZMB, Center for Microscopy and Image Analysis University of Zurich, Switzerland;2. NMI Natural and Medical Sciences Institute, Reutlingen, Germany, Department of Materials, Cells and Biomaterials, ETH Zurich, Switzerland;3. ETH Zurich, Department of Materials, HCI E 415, Cells and Biomaterials, Wolfgang‐Pauli‐Strasse 10, CH‐8093 Zürich, Switzerland
Abstract:
Keywords:Cell‐to‐substrate interface  Critical point‐dried cells for FIB/SEM  FIB‐milling on biological samples  In situ FIB‐milling
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号