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平面绝对检测闭环自检实验研究
引用本文:张凌华,韩森,吴泉英,唐寿鸿,李雪园,王全召.平面绝对检测闭环自检实验研究[J].计量学报,2019,40(2):208-212.
作者姓名:张凌华  韩森  吴泉英  唐寿鸿  李雪园  王全召
作者单位:苏州科技大学,江苏苏州215009;苏州慧利仪器有限责任公司,江苏苏州215123;上海理工大学,上海200093;苏州慧利仪器有限责任公司,江苏苏州215123;苏州维纳仪器有限责任公司,江苏苏州215123;苏州科技大学,江苏苏州,215009;上海理工大学,上海200093;苏州慧利仪器有限责任公司,江苏苏州215123;苏州慧利仪器有限责任公司,江苏苏州215123;苏州维纳仪器有限责任公司,江苏苏州215123;苏州维纳仪器有限责任公司,江苏苏州,215123
基金项目:国家重大科学仪器设备开发专项(2016YFF0101900)
摘    要:基于Ai C和Wyant J C的奇偶函数法,提出了4步旋转绝对检测方法,减少了旋转次数,将第二次测量的旋转角度选为90°。实验基于HOOL L9600A-HS3干涉仪,采用4步旋转绝对检测方法,将3个平面两两互检计算出3个平面的绝对面形。其中平面C的表面面形起伏高度均方根(RMS)值和峰谷(PV)值分别为3.460 nm和35.227 nm,经闭环自检后的测量结果分别为3.783 nm和34.305 nm以及3.669 nm和34.252 nm,数据基本一致,表明测量数据能够实现闭环自检。使用该方法对中国计量科学研究院的标准平面镜进行测量, 平面的RMS值和峰谷PV值分别为2.400 nm和19.600 nm,与该院的测量结果2.000 nm和16.000 nm对比,两者的测量偏差在nm量级,充分证明了实验的有效性及高重复性;此外实验还分析了温度对测量结果的影响。

关 键 词:计量学  面形测量  4步旋转绝对检测法  闭环自检  重复性
收稿时间:2017-11-27

Absolute Test of Optical Planar by Closed Loop
ZHANG Ling-hua,HAN Sen,WU Quan-ying,TANG Shou-hong,LI Xue-yuan,WANG Quan-zhao.Absolute Test of Optical Planar by Closed Loop[J].Acta Metrologica Sinica,2019,40(2):208-212.
Authors:ZHANG Ling-hua  HAN Sen  WU Quan-ying  TANG Shou-hong  LI Xue-yuan  WANG Quan-zhao
Affiliation:1. Suzhou University of Science and Technology, Suzhou, Jiangsu 215009, China
2. University of Shanghai for Science and Technology, Shanghai 200093, China
3. Suzhou H&L Instruments LLC, Suzhou, Jiangsu 215123, China
4. Suzhou W&N Instruments LLC, Suzhou, Jiangsu 215123, China
Abstract:Based on the Ai C and Wyant J C method of odd and even functions, a four-step rotary absolute test method is proposed to reduce the number of rotations and select the rotation angle of the second measurement as 90°. Experiment is based on HOOL L9600A-HS3 interferometer, using four-step rotation absolute measurement method, the three planes test with each other to calculate the absolute surface of the three planes, in which the plane C surface topography height root mean square (RMS) value and peak valley (PV) are 3.460 nm and 35.227 nm. After closed-loop self-test, measurement results are 3.783 nm and 34.305 nm,3.669 nm and 34.252 nm, it indicating that the measurement data can be closed-loop self-test. Using this method, the plane of National Institute of Metrology in China is measured. The RMS value and and the PV value of the plane are 2.400 nm and 19.600 nm, respectively, which are compared with the measurement results of 2.000 nm and 16.000 nm of National Institute of Metrology. The measurement deviation is on the order of nm, the measurement results fully proves the effectiveness of the experiment and high repeatability. In addition, the experiment also analyzes the influence of temperature on the measurement results.
Keywords:metrology  surface topography  four-step rotary absolute test method  closed-loop self-test  repeatability  
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