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基于CCD的CDT电子束着屏误差自动测试系统
引用本文:毕岗,李志能,曾宇.基于CCD的CDT电子束着屏误差自动测试系统[J].光电工程,2003,30(4):42-45.
作者姓名:毕岗  李志能  曾宇
作者单位:浙江大学信息与电子工程学系,浙江,杭州,310027
摘    要:利用CCD图像传感器和图像采集处理技术,实现了电子束着屏误差二维自动测量。在荧光屏的前端附加垂直和水平两组微偏转线圈,通过控制微偏转线圈的电流,改变着屏点附近的磁场,使电子束着屏点的位置在一个粉点范围内精确连续可调。标准光栅的测试验证,系统绝对误差小于5m,表明该系统稳定可靠,一致性好。

关 键 词:自动测试系统  电子束着屏误差  彩色显示管  微偏转线圈
文章编号:1003-501X(2003)04-0042-04
收稿时间:2002/12/28
修稿时间:2002年12月28

An automatic testing system based on CCD for color display tube electron beam landing screen error
BI Gang,LI Zhi-neng,ZENG Yu.An automatic testing system based on CCD for color display tube electron beam landing screen error[J].Opto-Electronic Engineering,2003,30(4):42-45.
Authors:BI Gang  LI Zhi-neng  ZENG Yu
Abstract:D automatic measurement of electron beam landing screen error is realized by means of CCD image sensor and image processing techniques. By attaching two groups of vertical and horizontal mini-deflection coil at front end of screen, through controlling current of mini-deflection coil and changing magnetic field near electron beam landing screen point, the position of the point is continuously adjustable within the range of a phosphor powder spot. Test of standard grating demonstrates that the system absolute error is less than 5 microns. This shows that the system is stable and reliable, and has a good consistency.
Keywords:Automatic measurement systems  Electron beam landing screen error  Color display tubes  Mini-deflection coil
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