The Si-O bonding in Na2O-TiO-SiO2 and K2O-TiO2-SiO2 glasses as studied by SiKβ X-ray fluorescence and infra-red absorption spectroscopy |
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Authors: | Sumio Sakka Hitoshi Hotta |
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Affiliation: | (1) Faculty of Engineering, Mie University, Tsu, Mie-Ken, Japan |
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Abstract: | The SiKβ fluorescence X-ray and infra-red absorption spectra of Na2O-TiO2-SiO2 and K2O-TiO2-SiO2 glasses have been measured in order to study the Si-O bonding as a function of the composition of glass. The chemical shifts
of the SiKβ peak relative to that of silica glass Δλ=λ(SiO2)-λ(specimen)>0] and the wavenumbers of the infra-red absorption peaks around 950cm−1 and 1100 cm−1 have been determined from the spectra. The SiKβ chemical shift in both series of glasses increased with increasing total content of R2O and TiO2 and with decreasing ratio of TiO2/(K2O+TiO2), where R2O represents Na2O or K2O. The infra-red peaks around 950 cm−1 and 1100 cm−1 shifted towards lower wavenumbers with increasing total content of R2O and TiO2 and with decreasing ratio of TiO2/(R2O+TiO2). These experimental facts were interpreted as showing that the Si-O bond in glass was weakened as the total content of R2O and TiO2 increased and that the Si-O bond was weakened by R2O more than by TiO2. |
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