|
|||||
|
|
Analytical methods for superresolution dislocation identification in dark-field X-ray microscopy |
|
| Authors: | Brennan Michael C Howard Marylesa Marzouk Youssef Dresselhaus-Marais Leora E |
| Affiliation: | 1.Department of Aeronautics and Astronautics, Center for Computational Science and Engineering, Massachusetts Institute of Technology, 77 Massachusetts Ave, Cambridge, MA, 02139, USA ;2.Experimental Operations, Nevada National Security Site, 232 Energy Way, North Las Vegas, NV, 89030, USA ;3.Department of Materials Science and Engineering, Stanford University, 476 Lomita Mall, Stanford, CA, 94305, USA ;4.Department of Photon Science, SLAC National Accelerator Laboratory, 2575 Sand Hill Rd, Menlo Park, CA, 94025, USA ;5.Physics Division, Lawrence Livermore National Laboratory, 7000 East Ave, Livermore, CA, 94550, USA ; |
| Abstract: | Journal of Materials Science - We develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM)—achieving... |
| Keywords: | |
| 本文献已被 SpringerLink 等数据库收录！ | |