Optical properties of manganese films |
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Authors: | M A Angadi K Nallamshetty |
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Affiliation: | (1) Department of Physics, University of the West Indies, St Augustine, Trinidad |
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Abstract: | The optical properties of thin manganese films in the thickness range 40 to 1200 nm are reported for UV, visible end near infrared regions. The reflectance and absorbance of annealed and unannealed manganese films is measured from film side and substrate side, in the wavelength range 190 to 900 no and for normal incidence of light. These measurements are used to calculate the refractive index (n), extinction coefficient (k), and the imaginary part of the dielectric constant (). |
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