基于双方差随机过程的半导体激光器寿命评估

针对高可靠、长寿命半导体激光器的寿命评估问题，提出了基于双方差随机过程的性能退化评估方法。该方法不仅考虑了半导体激光器内部失效机理的固有随机性，还考虑了由人为因素、测量仪器等引起的测量随机误差。首先，建立了半导体激光器性能退化模型及其未知参数的极大似然估计方法。然后，基于首达时的概念给出了失效时间分布函数和概率密度函数的解析表达式，以对半导体激光器的可靠性和寿命进行评估。最后，通过半导体激光器寿命评估工程实例验证了所提出方法的适用性和有效性。结果表明：与现有的性能退化模型相比，所构建模型的拟合效果更好，能够提高寿命评估精度。这可为半导体激光器及其整机系统最优维修决策的制定提供有力支撑。

Lifetime evaluation of semiconductor laser based on dual-variance stochastic process

Aiming at the problem of lifetime evaluation for highly reliable and long-life semiconductor lasers, a performance degradation assessment method based on the dual-variance stochastic process was proposed. This method not only considered the inherent randomness of the internal failure mechanism of semiconductor lasers, but also took into account measurement random errors caused by human factors, measuring instruments and so on. Firstly, the performance degradation model of semiconductor laser and the maximum likelihood estimation method for its unknown parameters were established. Then, based on the concept of first arrival, the analytical expressions of failure time distribution function and probability density function were given to evaluate the reliability and lifetime of semiconductor lasers. Finally, the applicability and effectiveness of the proposed method were verified by a semiconductor laser lifetime evaluation engineering example. The results showed that compared with the existing performance degradation model, the constructed model had better fitting effect and could improve the accuracy of lifetime evaluation, which could provide strong support for the optimal maintenance decision-making of the semiconductor laser and its whole system.