Laser ablated ZnO layers for ALGaN/GaN HEMT passivation |
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Authors: | G Vanko M ValloJ Bruncko T Lalinský |
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Affiliation: | a Institute of Electrical Engineering of the Slovak Academy of Sciences, Dúbravská cesta 9, 84104 Bratislava, Slovakia b International Laser Center, Ilkovi?ova 3, 812 19 Bratislava, Slovakia |
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Abstract: | ZnO layer in a role of passivation of the AlGaN/GaN-based high electron mobility transistors (HEMTs) is presented. The thin layer is deposited by pulsed laser deposition technique. It is fully compatible with the process technology of high electron mobility transistors prepared on AlGaN/GaN heterostructures due to its physical properties similar to the GaN. We have succeeded to (1) suppress the gate leakage current; (2) increase the maximum of the drain current and the electron drift mobility, and (3) ensure the threshold voltage to be unaltered by employment of the thin ZnO layer to the channel area of the HEMT. |
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Keywords: | Passivation layer C-HEMT ZnO AlGaN/GaN heterostructures Laser ablation |
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