首页 | 本学科首页   官方微博 | 高级检索  
     


Theoretical and experimental study of fatigue growth of interacting cracks
Affiliation:1. School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, China;2. The Key Laboratory for Conveyance and Equipment of the Education Ministry of China, East China Jiaotong University, Nanchang 330013, China;3. State Key Laboratory of Refractories and Metallurgy, Wuhan University of Science and Technology, Wuhan 430081, China;4. State key Laboratory of Advanced Technology for Materials Synthesis and Processing, Wuhan University of Technology, Wuhan 430070, China;5. Department of Mechanical Engineering, Texas A&M University College Station, TX 77840, USA;1. University of Zagreb, Faculty of Mechanical Engineering and Naval Architecture, Institute of Applied Mechanics, Ivana Lu?i?a 5, 10 000 Zagreb, Croatia;2. University of Zagreb, Faculty of Metallurgy, Department of Mechanical Metallurgy, Aleja narodnih heroja 3, 44 000 Sisak, Croatia
Abstract:Life assessment of structures weakened by interacting cracks represents an important and very challenging problem. Subsequently, the main objective of this paper is to address this problem by developing a new computational technique. It is based on the classical strip-yield model and plasticity-induced crack closure concept. It also utilises the 3D fundamental solution for an edge dislocation. The crack advance scheme adopts the cycle-by-cycle calculations of the effective stress intensity factors and crack increments. The modelling results are validated against an experimental study focusing on fatigue behaviour of two closely spaced collinear cracks in wide plates with different thicknesses. It is confirmed that non-linear effects associated with crack interaction have a significant influence on fatigue life and cannot be disregarded in life and integrity assessments of structural components.
Keywords:Interacting cracks  Fatigue crack growth  Strip yield model  Plate thickness effect  Plasticity induced closure
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号