Measurement on nano scale by scanning probe microscope for obtaining real ice adhesion force |
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| Affiliation: | 1. Department of Precision Mechanics, Chuo University, 1-13-27 Kasuga, Bunkyo-ku, Tokyo 112-8551, Japan;2. Nikon Corporation, 1-12-1, Yurakucho, Chiyoda-ku, Tokyo 100-8331, Japan;3. Chuo University, 1-13-27 Kasuga, Bunkyo-ku, Tokyo 112-8551, Japan;1. Institute of Refrigeration and Cryogenics, Shanghai Jiao Tong University, Shanghai 200240, China;2. Department of Energy and Power Engineering, Beijing University of Civil Engineering and Architecture, Beijing 100044, China;1. Key Laboratory of Cryogenics, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Haidian District, Beijing 100190, China;2. University of Chinese Academy of Sciences, Beijing 100049, China;1. College of Materials, Xiamen University, Xiamen, Fujian 361005, China;2. Fujian Key Laboratory of Advanced Materials, Xiamen, Fujian 361005, China;3. CSIRO Materials Science and Engineering, 37 Graham Road, Highett, VIC 3190, Australia |
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| Abstract: | It is important to know a real ice adhesion force on a cooling solid surface. When an ice adhesion force is measured by giving a shearing force at the interface between the solid surface and ice, there is a possibility that a measured ice adhesion force is an apparent value including a force that destroys ice due to unevenness of the surface. Thus, to measure the ice adhesion force without influence of the surface unevenness, one of the authors developed a method for measuring the ice adhesion force on the nano scale by using a scanning probe microscope. In this paper, ice adhesion forces to copper oxide and hard glass test plates were measured at −5 °C on the nano scale by this method, and the real ice adhesion forces could be measured. Moreover, the representative value of proper shearing stresses obtained by real ice adhesion forces divided each ice adhesion area was given. |
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| Keywords: | Adhesion Ice Surface unevenness Nano scale SPM Adhérence Glace Surface accidentées Echelle nano Microscope à sonde locale (SPM) |
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