Fourth- and higher-order small-perturbation solution for scattering from dielectric rough surfaces |
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| Authors: | Demir Metin A Johnson Joel T |
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| Affiliation: | Department of Electrical Engineering and ElectroScience Laboratory, The Ohio State University, 205 Dreese Laboratories, 2015 Neil Avenue, Columbus, Ohio 43210, USA. |
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| Abstract: | A recursive solution of the small-perturbation method for rough surface scattering is presented. These results permit fourth- and higher-order corrections to rough surface scattering coefficients to be determined in a form that explicitly separates surface and electromagnetic properties. Sample results are presented for the fourth-order correction to the specular reflection coefficient of a rough surface and the sixth-order correction to incoherent scattering cross sections. |
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