| X-ICT中连续谱服从Gauss分布的硬化修正研究 |
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| 引用本文： | 彭光含,杨学恒.X-ICT中连续谱服从Gauss分布的硬化修正研究[J].无损检测,2005,27(11):565-568. |
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| 作者姓名： | 彭光含 杨学恒 |
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| 作者单位： | 1. 湖南文理学院,物电系,常德,415000
2. 重庆大学,数理学院,重庆,400044 |
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| 摘 要： | 在X射线工业计算机断层扫描成像技术(X-ICT)中,X射线源的能谱I0(E)为入射强度随能量E的分布函数。而分布函数I0(E)与E的关系随X射线管电压不同而变化,需要通过试验测定。入射强度分布函数是大量光子运动的统计规律,由于Gauss分布在统计中的普遍性,同时,相关文献对X射线源能谱的试验研究分析,表明X射线源能谱与Gauss分布的相似性,因此可用Gauss分布来描叙X射线源连续谱I0(E)的分布规律。提出了X-ICT中X射线能谱服从Gauss分布的硬化修正模型和新的软件修正程序方法。
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| 关 键 词： | X射线检测 工业计算机断层扫描成像技术 连续谱 高斯分布 硬化修正 |
| 文章编号： | 1000-6656（2005）11-0565-03 |
| 收稿时间： | 2004-10-08 |
| 修稿时间： | 2004年10月8日 |
Hardening Correction Calculation of the Energy Spectrum of Continuous Spectrum X-ICT by Gauss Distribution |
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| PENG Guang-han,YANG Xue-heng.Hardening Correction Calculation of the Energy Spectrum of Continuous Spectrum X-ICT by Gauss Distribution[J].Nondestructive Testing,2005,27(11):565-568. |
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| Authors: | PENG Guang-han YANG Xue-heng |
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| Affiliation: | Department of Physics and Electronic Engineering, Hunan University of Arts and Science, Changde 415000, China;College of Mat hematics and Science, Chongqing University, Chongqing 400044, China |
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| Abstract: | Energy spectrum I_0(E) was a distribution function of incident intensity variating with energy E in X-ray industrial computed tomography(X-ICT).However,the relationship between I_0(E) and E variated with X-ray tube voltage and it would be known by experiment.Incident intensity distribution function was the statistical rule of photon action.On account of Gauss distribution nature in statistic,it was possible to describe I_0(E) by Gauss distribution and their similarity was shown by literature.The model for hardening correction calculation of the energy spectrum in X-ICT was given and a new correction method was brought forward. |
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| Keywords: | X-radiographic testing Industrial computed tomography Continuous spectrum Gauss distribution Hardening correction |
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