基于广义AO~*算法的测试序列问题研究

测试序列问题的目标是用最小的期望测试费用找到最佳测试序列。提出了一种广义AO*算法解决了电子设备的测试序列问题。对传统的AND/OR图进行扩展得到一种广义的AND/OR图,它不仅能够提高AND/OR图的表达能力而且能够实现推理操作符与问题之间的多对多关系;描述了广义AO*算法的步骤并且分析了该算法的计算复杂度。通过实例说明广义AO*算法不仅可有效减少计算复杂度和平均测试代价,而且生成的故障诊断策略能快速、有效的指导维修人员定位故障以减少维修代价。

Research on Test Sequencing Problem Based on Generalized AO~* Algorithm

The objective of the test sequencing problem is to develop an optimal test sequence with the minimal expected test cost.For solving the problem of the electronic equipment,a generalized AO* algorithm was presented.The traditional AND/OR graph was extended to the generalized AND/OR graph,which improves the expressive ability of AND/OR graph and achieves the many-to-many relation between reasoning operator and unsolved problems;the steps of the generalized AO* algorithm were described and its complexity was a...