首页 | 本学科首页   官方微博 | 高级检索  
     

电荷耦合器件积分时间对微型成像系统成像质量的影响
引用本文:宋勇,郝群,王涌天.电荷耦合器件积分时间对微型成像系统成像质量的影响[J].兵工学报,2003,24(3):338-341.
作者姓名:宋勇  郝群  王涌天
作者单位:北京理工大学光电工程系,北京,100081
摘    要:在光圈固定的情况下,确定合适的积分时间对于提高微型电荷耦合器件(CCD)成像系统的成像质量,增强微型飞行器的侦察能力具有十分重要的意义。本文讨论了决定CCD积分时间的各种因素,重点研究了适用于微型飞行器的CCD成像系统的积分时间与像移的关系,并进一步推导了计算像移量的相关数学模型。利用该模型对不同积分时间内采集的运动图像进行了像质评价,结果表明,在保证曝光量的前提下,当像移量被限制在1个像素内时,可以获得相对理想的运动图像像质。

关 键 词:电荷耦合器件  积分时间  成像系统  成像质量  CCD  曝光量  噪声  像移  微光机电系统

EFFECT OF CHARGE COUPLED DEVICE INTEGRATION TIME ON THE IMAGING QUALITY OF A MICRO IMAGING SYSTEM
Song Yong,Hao Qun,Wang Yongtian.EFFECT OF CHARGE COUPLED DEVICE INTEGRATION TIME ON THE IMAGING QUALITY OF A MICRO IMAGING SYSTEM[J].Acta Armamentarii,2003,24(3):338-341.
Authors:Song Yong  Hao Qun  Wang Yongtian
Abstract:When the numerical aperture of a lens is fixed,it is important to select the correct CCD integration time in order to improve the imaging quality of a micro imaging system and enhance the reconnaissance ability of micro air vehicles. The main factors affecting the CCD integration time were analyzed. A study was made on the relationship between the CCD integration time of a micro imaging system used in MAVs and its image smear, and a mathematical model to calculate and analyze the image smear was established. The model is used for evaluating the quality of moving images captured in different CCD integration time. The experimental results indicate that when the image smear is limited to a single pixel, high quality moving images can be obtained on the condition that the exposure is appropriate.
Keywords:applied optics  charge coupled device  integration time  image smear  micro optical  electro  mechanical system
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《兵工学报》浏览原始摘要信息
点击此处可从《兵工学报》下载全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号