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TATB基PBX纳米孔隙的正电子湮没寿命谱
引用本文:杨仍才,田勇,张伟斌,杜宇.TATB基PBX纳米孔隙的正电子湮没寿命谱[J].含能材料,2011,19(2):200-203.
作者姓名:杨仍才  田勇  张伟斌  杜宇
作者单位:中国工程物理研究院化工材料研究所,四川绵阳,621900
基金项目:国防预研(42604030401)
摘    要:为研究压制参数对TATB基高聚物粘结炸药(PBX)微观结构的影响,压制了密度为1.6~1.9 g·cm-3的PBX,采用了正电子湮没寿命谱(PALS)技术表征了其微观结构,讨论了不同压制密度PBX的纳米孔隙的变化.结果显示:压制密度越大,PBX中纳米孔隙浓度越小,平均尺寸越大,这表明压制过程中,PBX界面孔隙不断减小,...

关 键 词:高能物理学  TATB基PBX  压制  纳米孔隙  正电子湮没寿命谱
收稿时间:4/14/2010 8:17:48 PM
修稿时间:2010/10/31 0:00:00

Study on Positron Lifetime of Nano-void of TATB-based PBX
YANG Reng-cai,TIAN Yong,ZHANG Wei-bin and DU Yu.Study on Positron Lifetime of Nano-void of TATB-based PBX[J].Chinese Journal of Energetic Materials,2011,19(2):200-203.
Authors:YANG Reng-cai  TIAN Yong  ZHANG Wei-bin and DU Yu
Affiliation:Institute of Chemical Materials,Institute of Chemical Materials,Institute of Chemical Materials,Institute of Chemical Materials
Abstract:Several groups of TATB-based PBX specimen with same components but different densities are prepared by different press intensities, and their positron lifetime spectra are measured. The spectra show that the positronium formation is negligible in TATB-based PBX, therefore the 2-component fit is applicable. The result shows an increasing dimension but decreasing concentration of nano-void during PBX pressing, which means the nano-void in TATB crystalline increased due to the damage and crack under pressure, however the nano-void of intergranular interface decreased.
Keywords:high-energy physics  TATB-based PBX  pressing  nano-void  positron annihilation lifetime spectroscopy
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