| 半导体器件与电路辐照响应测试系统 |
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| 引用本文： | 任迪远,高文钰.半导体器件与电路辐照响应测试系统[J].核技术,1994,17(9):542-547. |
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| 作者姓名： | 任迪远 高文钰 |
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| 作者单位： | 中国科学院新疆物理研究所 |
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| 摘 要： | 介绍用于测量ＭＯＳ电容、ＭＯＳＦＥＴ、半导体元器件和集成电路辐照效应的微机测试系统及其功能，并给出该系统在半导体辐射损伤研究甲的应用实例．
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| 关 键 词： | 半导体器件 集成电路 辐射效应 |
A measurement system for investigating radiation effects of semiconductor devices and circuits |
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| Ren Diyuan, Gao Wenyu, Yu Xuefeng, Lu Wu, Zhang Guoqiang,Fan Long, Luo Laihui, Yan Rongliang.A measurement system for investigating radiation effects of semiconductor devices and circuits[J].Nuclear Techniques,1994,17(9):542-547. |
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| Authors: | Ren Diyuan Gao Wenyu Yu Xuefeng Lu Wu Zhang Guoqiang Fan Long Luo Laihui Yan Rongliang |
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| Abstract: | A computer based measurement system for the study of radiation effects on MOS structures, such as MOS capacitors, MOSFETs, semiconductor devices and integrated circuits was introduced in this paper. The system's function was described and some application examples were given. |
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| Keywords: | Semiconductor devices Integrated circuits Radiation effect Computer based measurement system |
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