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Experimental Study on Electrical Breakdown for Devices with Micrometer Gaps |
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| Authors: | MENG Guodong CHENG Yonghong DONG Chengye WU Kai |
| Affiliation: | State Key Lab. of Electrical Insulation and Power Equipment, Xi'an Jiaotong University,Xi'an 710049, China |
| Abstract: | electrical breakdown, micrometer gaps, field emission, surface dielectric states,surface resistivity, secondary electron yield |
| Keywords: | electrical breakdown micrometer gaps field emission surface dielectric states surface resistivity secondary electron yield |
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