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| 麦秆皮层硅化物的XPS研究(Ⅰ) | |
| 引用本文： | 邱玉桂,欧海龙,陈春霞,云娜,岑丹霞.麦秆皮层硅化物的XPS研究(Ⅰ)[J].中国造纸学报,2009,24(4). |
| 作者姓名： | 邱玉桂 欧海龙 陈春霞 云娜 岑丹霞 |
| 作者单位： | 1. 华南理工大学制浆造纸工程国家重点实验室,广东广州,510640;国家纸制品质量监督检验中心,广东东莞,523808 2. 国家纸制品质量监督检验中心,广东东莞,523808 3. 华南理工大学制浆造纸丁程国家重点实验室,广东广州,510640;广东轻工职业技术学院,广东广州,510300 4. 厦门大学分析测试中心,福建厦门,361005 |
| 摘 要： | 进行麦秆皮层硅化物的XPS测定及分峰拟合分析.结果表明,麦秆不同部位皮层中的硅化物都是由有机硅化物和无机硅化物组成的.有机硅化物主要有线状p-MethylSil、树脂p-PlnenylSil、Ph_3 SiOSiPh_3、Ph_4Si、Et_3SiCl、Et_2 SiCl_2等.无机硅化物的种类更复杂,主要有硅灰石、云母、钠长石、硅线石、高岭土、分子筛A型及x型物质以及5种结晶形式的SiO_2等.不同部位硅化物的组成、含量不同,将影响其在制浆等处理过程中的稳定性. |
| 关 键 词： | 麦秆皮层 硅化物 XPS 分蜂拟合 有机硅化物 无机硅化物 |
Study on the Silicides in Cuticle of Wheat Straw Stem by Means of XPS(I) |
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| QIU Yu-gui,OU Hai-long,CHEN Chun-xia,YUN Na,CEN Dan-xia.Study on the Silicides in Cuticle of Wheat Straw Stem by Means of XPS(I)[J].Transactions of China Pulp and Paper,2009,24(4). | |
| Authors: | QIU Yu-gui OU Hai-long CHEN Chun-xia YUN Na CEN Dan-xia |
| Abstract: | The silicides in the cuticle of wheat straw stem were studied by means of XPS-peak-differenating analysis. The results showed that silicides in every part of the wheat straw stem are composed of two sorts of silicides, i. e. organic silicides and inorganic silicides. The main components of the organic silicides are P-MethylSil (linear), P-PhenylSil (resin), Ph_3Si0SiPh_3, Me_3Si0SiMe_3, Ph_3SiSiPh_3, Et_3SiCl, Et_2SiCl_2 etc. The inorganic organic silicides are very complex, and the major sorts are Wollastonii, Mica, albite, Kaolinite, silliraanite, materials of Mol. Sieve A and X, SiO_2(Vycor) , SiO_2(alpha Cristobal) , SiO_2(guartz) , H Zeoton etc. The components of silicides in different part's cuticle are different. |
| Keywords: | cuticle of wheat straw stem: silicides: XPS: peak-differenating-imitatios: organic silicides: inorganic sili'cides |
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