| 铅同位素比值的飞行时间二次离子质谱法测量 |
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| 引用本文： | 宋玲根,蔡磊.铅同位素比值的飞行时间二次离子质谱法测量[J].质谱学报,1996,17(4):39-44. |
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| 作者姓名： | 宋玲根 蔡磊 |
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| 作者单位： | 复旦大学材料科学系 |
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| 摘 要： | 介绍了用飞行时间二次离子质谱法对器物中的铅同位素比值的测量。在仔细地讨论了质量干扰、二次离子产额的同位素分馆效应等对测量结果的影响后，认为本工作无需标准样品，可以实现对样品无损的高质量分辨的二次离子质谱分析。铅同位素比值的测量精确度优于１％。
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| 关 键 词： | 飞行时间二次离子质谱，无标样，铅位素比值 |
Measurement of Lead Isotpe by TOF-SIMS |
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| Song Linggen,Cai Lei,Ren Yunzhu,Li Baiyun,Tao Yin,Gao Yongming,Zong Xiangfu.Measurement of Lead Isotpe by TOF-SIMS[J].Journal of Chinese Mass Spectrometry Society,1996,17(4):39-44. |
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| Authors: | Song Linggen Cai Lei Ren Yunzhu Li Baiyun Tao Yin Gao Yongming Zong Xiangfu |
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| Abstract: | Isotope ratios of Pb contained in wares were measured using Time-Of-Flight Secondary Ion Mass Spectrometry(TOF-SIMS)without any references.The facts of mass inference and isotope fraction in this measurement were discussed in detail.The precision was better than 1%. |
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| Keywords: | TOF-SIMS non-reference lead isotope ratios |
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