| 全反射X射线荧光光谱仪的研制 |
| |
| 引用本文： | 李国会,朱永奉.全反射X射线荧光光谱仪的研制[J].分析测试仪器通讯,1995,5(3):129-132. |
| |
| 作者姓名： | 李国会 朱永奉 |
| |
| 作者单位： | 地矿部物探与化探研究所，地矿部物探与化探研究所，地矿部成都地质矿产研究所，地矿部科技司 河北廊坊 102849，河北廊坊 102849，成都 610082，北京 100812 |
| |
| 摘 要： | 文章报道了由地矿部物化探研究所和成都地矿所联合研制的全反射Ｘ射线荧光（ＴＲＸＲＦ）分析装置。介绍了全反射原理及装置的结构特点。该样机与常规的Ｘ射线光谱仪相比，对１２种元素的检出限降低了２－３个数量级。
|
| 关 键 词： | 全反射X射线 荧光光谱仪 制造 |
Total Reflection X-Ray Fluorescence Spectrometer |
| |
| Authors: | Li Guohui Fan Shouzhong |
| |
| Abstract: | A total reflection X-ray fluorescence(TRXRF) spectrometer was developed by Institute of Geophysical and Geochemical Exploration and Chengdu Institute of Geology and Mineral Resources. The basic principles of TRXRF and structure features of the prototype instrument were demonstrated. Detection limits for 12 elements obtained from this instrument were 2 to 3 orders of magnitude lower than these obtained from ordinary XRF spectrometer. |
| |
| Keywords: | total reflection X-ray fluorescence (TRXRF) spectrometer structure features |
| 本文献已被 CNKI 维普 等数据库收录！ |
