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Measurement of Sub-Nanometer Lubricant Films Using Ultra-Thin Film Interferometry
Authors:RP Glovnea  AK Forrest  AV Olver  HA Spikes
Affiliation:(1) Mechanical Engineering Department, Imperial College, London, SW7 2AZ, UK
Abstract:The ultra-thin film interferometric method of measuring the thickness of very thin films in lubricated contacts has been refined so as to be able to measure films down to 0.3thinspnm with a standard deviation of 0.15thinspnm. The main remaining source of measurement variation for films below 3thinspnm thick is the surface roughness of the contacting solids. This modified technique has been applied to study the film-forming properties of three fluids, hexadecane, a dilute solution of surfactant in hexadecane, and cyclohexane. Purified hexadecane shows a very slightly enhanced oil-film thickness below 1thinspnm. The long-chain surfactant forms a boundary film 2thinspnm thick. Cyclohexane behaves as though it forms a surface layer about 1thinspnm thick with viscosity three times the bulk fluid viscosity.
Keywords:lubrication  film thickness  thin film  optical interferometry  boundary lubrication  multiple beam interferometry
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