|
|||||
|
|
A rapid measurement method for structured surface in white light interferometry |
|
| Authors: | ZILI LEI XIAOJUN LIU LI ZHAO WENJUN YANG CHENG CHEN XIAOTING GUO |
| Affiliation: | State Key Laboratory of Digital Manufacturing Equipment and Technology, School of Mechanical Science and Engineering, Huazhong University of Science and Technology, Wuhan, PR China |
| Abstract: | |
| Keywords: | Hilbert transform (HT) phase unwrapping sampling analysis single-frame interferogram structured surface measurement white light interferometry (WLI) width of the fringes |