Energy filtering transmission electron microscopy using the new JEM-2010FEF |
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Authors: | TOMOKIYO MATSUMURA & MANABE |
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Affiliation: | Department of Materials Science and Engineering,;Department of Applied Quantum Physics and Nuclear Engineering,;Research Laboratory for High Voltage Electron Microscopy, Kyushu University, Fukuoka 812-8581, Japan |
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Abstract: | The new JEM-2010FEF electron microscope provides useful techniques based on energy filtering as an omega-type energy filter is integrated into a thermal field-emission 200 kV transmission electron microscope. For example, the zero-loss imaging improves the contrast of high resolution lattice images as well as images of precipitates or lattice defects in alloys. The acquisition time for elemental mapping with core-loss electrons is one order in magnitude shorter than with energy-dispersive X-ray spectroscopy. The removal of inelastically scattered electrons enables us to observe weak lines in convergent-beam electron diffraction patterns from a thicker specimen with a probe size 1–2 nm in diameter. A combination of the field emission gun and sensitive recording media such as an imaging plate and a slow-scan CCD camera makes the energy filtering more powerful. |
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Keywords: | convergent-beam electron diffraction electron spectroscopic diffraction electron spectroscopic imaging elemental mapping energy filtering field emission gun higher order Laue zone imaging filter imaging plate omega-filter transmission electron microscopy zero-loss image |
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