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Focused ion beam preparation of microbeams for in situ mechanical analysis of electroplated nanotwinned copper with probe type indenters
Authors:STUART ROBERTSON  SCOTT DOAK  FU-LONG SUN  ZHI-QUAN LIU  CHANGQING LIU  ZHAOXIA ZHOU
Affiliation:1. Department of Materials, Loughborough Materials Characterisation Centre, Loughborough University, Loughborough, U.K.;2. Institute of Metal Research, Chinese Academy of Sciences, Shenyang, P.R. China;3. Wolfson School of Mechanical, Electrical and Manufacture Engineering, Loughborough University, Loughborough, LE11 3TU U.K.
Abstract:
Keywords:Chunk lift-out  focused ion beam  in situ  micromechanical testing  nanotwinned copper  P-FIB
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