Profilometer of secondary beams based on a multiwire proportional chamber |
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| Authors: | R A Astabatyan S M Lukyanov E R Markaryan V A Maslov Yu E Penionzhkevich R V Revenko V I Smirnov |
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| Affiliation: | (1) Department of Mechanical and Environmental Engineering, University of California, Santa Barbara, 2355 Engineering Building II, 93106 Santa Barbara, CA, USA;(2) Hewlett Packard Laboratories, 1501 Page Mill Road, 94304 Palo Alto, CA, USA |
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| Abstract: | A profilometer for diagnostics of secondary ion beams with Z ≥ 2 is described. Two methods of beam profile measurements are compared: a counting method, when pulses from each particle
are registered, and a current method with channel-by-channel measurement of the integral current. The counting characteristics
and the lifetimes of the profilometer for these methods of beam profile measurements are compared. |
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