基于LabVIEW的MOS电容高频C-V特性测试平台研究

文中介绍了一种基于LabVIEW的MOS电容C-V特性测试仪.该测试仪采用二次滤波(滤波-放大-滤波)替代传统的变频放大技术;通过数据采集卡对检测结果进行数据采集,然后通过计算机处理,并用LabVIEW编程输出结果,同时通过数据采集卡的输出来控制待测MOS电容两端电压的变化,从而实现对MOS电容的准确测量.

Tester for High Frequency C-V Characteristic of MOS Structure Based on LabVIEW

This paper introduced a tester that measured the high frequency C - V characteristic of MOS structure capacitor based on LabVIEW. The tester substituted twice filter technology for proposed frequency conversion technology. Data collection from the testing circuits was implemented through the data collection card, and then the computer was used for processing the data which was processed and displayed by using LabVIEW program. The change of voltage in both nodes of the MOS capacitor was controlled by the output of the data collection card. With the method,the MOS capacitor can be measured quickly and exactly.