| 基于非分光红外技术的低浓度SF6气体检测方法 |
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| 引用本文： | 袁子茹,汪献忠,吕运朋,薛冰.基于非分光红外技术的低浓度SF6气体检测方法[J].仪表技术与传感器,2012(1):80-81,84. |
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| 作者姓名： | 袁子茹 汪献忠 吕运朋 薛冰 |
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| 作者单位： | 1. 郑州大学,河南郑州,450001
2. 河南日立信股份有限公司,河南郑州,450001 |
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| 摘 要： | 文中介绍了一种基于非分光红外技术(NDIR)的高灵敏度的SF6气体浓度检测仪,测量范围可达0～50 ppm(1ppm=10-6),精度为0.1 ppm,由于传感器的特殊结构设计,使得其可以定点检测出SF6断路器或者GIS高压开关设备的微量泄露,对于设备的密封性检测有着实际的意义。
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| 关 键 词： | 非分光红外 SF6 便携式 微量泄漏 |
Low Concentration of SF6 Gas Detection Method Based on NDIR Technology |
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| YUAN Zi-ru
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WANG Xian-zhong
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Lü Yun-peng
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XUE Bing.Low Concentration of SF6 Gas Detection Method Based on NDIR Technology[J].Instrument Technique and Sensor,2012(1):80-81,84. |
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| Authors: | YUAN Zi-ru WANG Xian-zhong Lü Yun-peng XUE Bing |
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| Affiliation: | 1.Physical Engineering College,Zhengzhou University,Zhengzhou 450001,China; 2.Corporation of Relations,Zhengzhou 450001,China) |
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| Abstract: | This paper presented a SF6 gas concentration detector with the high sensitivity based on non-spectral infrared(NDIR) technique.Its measuring range is up to 0 to 50 ppm,and the accuracy is 0.1 ppm.Due to the special structure of the sensor design,it can detect SF6 GIS high-voltage switchgear circuit breaker or trace leak tightness testing,the device has a practical significance. |
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| Keywords: | NDIR SF6 portable trace leaks |
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