| 基于傅里叶变换的数字散斑照相测量 |
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| 引用本文： | 曾媛,钱晓晨,顾页妮,韩朝霞,陶春先.基于傅里叶变换的数字散斑照相测量[J].光学仪器,2018,40(1):1-7. |
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| 作者姓名： | 曾媛 钱晓晨 顾页妮 韩朝霞 陶春先 |
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| 作者单位： | 上海理工大学 上海市现代光学系统重点实验室, 上海 200093;上海理工大学 光电信息与计算机工程学院, 上海 200093;上海理工大学 教育部光学仪器与系统工程研究中心, 上海 200093;上海理工大学 上海光学仪器研究所, 上海 200093,上海理工大学 上海市现代光学系统重点实验室, 上海 200093;上海理工大学 光电信息与计算机工程学院, 上海 200093;上海理工大学 教育部光学仪器与系统工程研究中心, 上海 200093;上海理工大学 上海光学仪器研究所, 上海 200093,上海理工大学 上海市现代光学系统重点实验室, 上海 200093;上海理工大学 光电信息与计算机工程学院, 上海 200093;上海理工大学 教育部光学仪器与系统工程研究中心, 上海 200093;上海理工大学 上海光学仪器研究所, 上海 200093,上海理工大学 上海市现代光学系统重点实验室, 上海 200093;上海理工大学 光电信息与计算机工程学院, 上海 200093;上海理工大学 教育部光学仪器与系统工程研究中心, 上海 200093;上海理工大学 上海光学仪器研究所, 上海 200093,上海理工大学 上海市现代光学系统重点实验室, 上海 200093;上海理工大学 光电信息与计算机工程学院, 上海 200093;上海理工大学 教育部光学仪器与系统工程研究中心, 上海 200093;上海理工大学 上海光学仪器研究所, 上海 200093 |
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| 基金项目： | 国家重点研发计划项目（2016YFF0101904） |
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| 摘 要： | 提出了基于傅里叶变换的双曝光散斑场的全场数字化测量。对双曝光散斑图进行傅里叶变换得到条纹图以灰度归一法和相位构造法将其优化,获取低噪声、高对比度的散斑干涉条纹。平面位移的测量实验结果表明,数字散斑照相技术适合计算机进行自动条纹识别和位移场计算,能得到较为精确的水平位移值,可实现变形场的精准测量。
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| 关 键 词： | 傅里叶变换 数字散斑照相 变形场 |
| 收稿时间： | 2017/11/8 0:00:00 |
Displacement measurement of digital speckle photography based on Fourier transform |
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| ZENG Yuan,QIAN Xiaochen,GU Yeni,HAN Zhaoxia and TAO Chunxian.Displacement measurement of digital speckle photography based on Fourier transform[J].Optical Instruments,2018,40(1):1-7. |
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| Authors: | ZENG Yuan QIAN Xiaochen GU Yeni HAN Zhaoxia and TAO Chunxian |
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| Affiliation: | Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;Engineering Research Center of Optical Instruments and Systems(MOE), University of Shanghai for Science and Technology, Shanghai 200093, China;Shanghai Institute of Optical Instruments, University of Shanghai for Science and Technology, Shanghai 200093, China,Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;Engineering Research Center of Optical Instruments and Systems(MOE), University of Shanghai for Science and Technology, Shanghai 200093, China;Shanghai Institute of Optical Instruments, University of Shanghai for Science and Technology, Shanghai 200093, China,Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;Engineering Research Center of Optical Instruments and Systems(MOE), University of Shanghai for Science and Technology, Shanghai 200093, China;Shanghai Institute of Optical Instruments, University of Shanghai for Science and Technology, Shanghai 200093, China,Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;Engineering Research Center of Optical Instruments and Systems(MOE), University of Shanghai for Science and Technology, Shanghai 200093, China;Shanghai Institute of Optical Instruments, University of Shanghai for Science and Technology, Shanghai 200093, China and Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China;Engineering Research Center of Optical Instruments and Systems(MOE), University of Shanghai for Science and Technology, Shanghai 200093, China;Shanghai Institute of Optical Instruments, University of Shanghai for Science and Technology, Shanghai 200093, China |
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| Abstract: | A whole-field digital measurement based on Fourier transform is proposed to realize double exposure speckle field.The bar chart received from double exposure specklegram through Fourier transform is optimized by grayscale normalization and phase construction to get a speckle interference fringe with low noise and high contrast.The experimental result of measuring plane displacement shows that digital speckle photography is suitable for automatic stripe identification and calculation of displacement field by computer to get accurate results of plane displacement,which can achieve the precise measurement of the deformation field. |
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| Keywords: | Fourier transform digital speckle photography deformation field |
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