| 基于SIPM的旋光色散波长测量方法 |
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| 引用本文： | 沈新荣,贾宏志,杨曦靓,刘刚,姜士昕,涂建坤.基于SIPM的旋光色散波长测量方法[J].光学仪器,2018,40(3):17-21. |
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| 作者姓名： | 沈新荣 贾宏志 杨曦靓 刘刚 姜士昕 涂建坤 |
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| 作者单位： | 上海理工大学光电信息与计算机工程学院;上海赛克力光电缆有限责任公司 |
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| 摘 要： | 提出了一种利用旋光色散进行波长测量的方法。采用高灵敏度的硅光电倍增管(SIPM)探测线偏振光通过旋光物质和无旋光物质时的输出光强随步进电机旋转而发生的变化,由此测出旋光物质的比旋光度,从而根据比旋光度的色散特征方程求出对应光源波长。大量实验证明,该波长测量装置的精度为1nm,标准差为0.06nm,该波长检测方法具有良好的可行性与稳定性,并且该测量装置具有结构简单、易于调节等特点。
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| 关 键 词： | 旋光色散 波长检测 硅光电倍增管(SIPM) |
| 收稿时间： | 2017/8/12 0:00:00 |
Method based on SIPM for determining wavelength with optical rotatory dispersion |
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| SHEN Xinrong,JIA Hongzhi,YANG Xiliang,LIU Gang,JIANG Shixing and TU Jiankun.Method based on SIPM for determining wavelength with optical rotatory dispersion[J].Optical Instruments,2018,40(3):17-21. |
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| Authors: | SHEN Xinrong JIA Hongzhi YANG Xiliang LIU Gang JIANG Shixing and TU Jiankun |
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| Affiliation: | School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China,School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China,School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China,School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China,School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China and Shanghai Secri Optical and Electric Cable Co., Ltd., Shanghai 200093, China |
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| Abstract: | A method is proposed for wavelength measurement by optical rotatory dispersion.The silicon photomultiplier(SIPM)with extremely high sensitivity is used to detect the output light intensity with or without optical active substance which varies with the rotation of the stepping motor.Then,the specific rotation of the optical active substance can be measured.The wavelength of the corresponding light source is obtained by the specific rotation dispersion equation.In the experiments,the precision of the wavelength measurement setup is about 1 nm and the standard deviation is 0.06 nm,which prove the feasibility and stability of proposed method.The measurement setup also has the characteristics of simple structure and is easy to adjust. |
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| Keywords: | optical rotatory dispersion wavelength measurement silicon photomultiplier(SIPM) |
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