| 显微观测技术的新进展及其应用 |
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| 引用本文： | 李艳军,左洪福,等. 显微观测技术的新进展及其应用[J]. 光学仪器, 2002, 24(2): 32-37 |
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| 作者姓名： | 李艳军 左洪福 等 |
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| 作者单位： | 南京航空航天大学民航学院,江苏,南京,210016 |
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| 摘 要： | 依据显微观测技术的发展过程 ,介绍了普通的光学显微镜和 2 0世纪流行的电子显微镜 ,详细阐述了以扫描隧道显微镜和激光扫描共焦显微镜为代表的新型显微镜系列的发展 ,以及各类显微镜的基本工作原理和应用情况
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| 关 键 词： | 显微镜 原理 应用 综述 |
| 文章编号： | 1005-5630(2002)02-0032-06 |
| 修稿时间： | 2001-09-03 |
Development and application of microscopic inspecting technology |
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| LI Yan jun,ZUO Hong fu,WU Zhen feng,YU Hui. Development and application of microscopic inspecting technology[J]. Optical Instruments, 2002, 24(2): 32-37 |
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| Authors: | LI Yan jun ZUO Hong fu WU Zhen feng YU Hui |
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| Abstract: | According to the development progress of microscopic inspecting technology, the ordinary optical microscope and the electron microscope (EM) that is popular in 20th century are introduced in this paper. The progress of some new microscopes represented by scanning tunneling microscope (STM) and laser scanning confocal microscope (LSCM), and their principles and applications are also expatiated particularly. |
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| Keywords: | microscope principle application summarization |
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