| 基于故障映射的FPGA互连资源故障测试与定位 |
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| 引用本文： | 项传银,阮爱武,李文昌,王林,廖永波.基于故障映射的FPGA互连资源故障测试与定位[J].仪器仪表学报,2011,32(9). |
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| 作者姓名： | 项传银 阮爱武 李文昌 王林 廖永波 |
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| 作者单位： | 电子科技大学电子薄膜与集成器件国家重点实验室 成都610054 |
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| 摘 要： | 由于FPGA互联资源故障定位是FPGA故障测试的一个难点,尤其需要准确地判断故障的类型和精确地定位故障的位置,因此文中提出一种通过故障映射方法将SRAM型FPGA的互连资源故障映射到LUT的输出上,间接地测试与定位互连资源故障的一种方法.同时将故障映射这种方法与传统经典的三次配置测试互连资源方法的核心思想相结合,在高故障率的FPGA中实现了互连资源的100％故障测试覆盖率,并精确地将故障定位至FPGA互连金属线段或PIP对.该算法采用了最小可重复单元结构,FPGA中被测试资源可以由连续或不连续的任意数量最小可重复单元组成,因此更适合FPGA的重复性结构和FPGA的在线测试.在FPGA的在线全覆盖测试中,该算法的最小迭代测试(ROTE)次数与FPGA的规模无关,只与用户应用电路所占FPGA总资源的比例相关.
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| 关 键 词： | FPGA测试 最小可重复单元 故障映射 故障测试与定位 |
Fault mapping based algorithm for fault detection and diagnosis of the interconnects in SRAM-based FPGAs |
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| Xiang Chuanyin,Ruan Aiwu,Li Wenchang,Wang Lin,Liao Yongbo.Fault mapping based algorithm for fault detection and diagnosis of the interconnects in SRAM-based FPGAs[J].Chinese Journal of Scientific Instrument,2011,32(9). |
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| Authors: | Xiang Chuanyin Ruan Aiwu Li Wenchang Wang Lin Liao Yongbo |
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| Affiliation: | Xiang Chuanyin,Ruan Aiwu,Li Wenchang,Wang Lin,Liao Yongbo(State Key Laboratory of Electronic Thin Films and Integrated Device,University of Electric Science and Technology of China,Chengdu 610054,China) |
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| Abstract: | Fault detection and diagnosis of programmable Interconnect Resources(IRs) poses challenge for FPGA testing,especially when it is necessary to decide fault type and fault location accurately.A fault mapping algorithm for fault detection and diagnosis of IRs is presented in this paper,which maps the faults of IRs to the outputs of corresponding LUTs.Combined with typical methodology of three testing configurations(TCs) of IRs,the proposed algorithm can achieve 100% fault coverage and locate faults in intercon... |
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| Keywords: | FPGA test repeatable unit fault mapping fault detection and diagnosis |
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