Ultra‐Wide Temperature Stable Dielectrics Based on Bi0.5Na0.5TiO3–NaNbO3 System |
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Authors: | Qi Xu Zhe Song Wenlin Tang Hua Hao Lin Zhang Millicent Appiah Minghe Cao Zhonghua Yao Zichen He Hanxing Liu |
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Affiliation: | State Key Laboratory of Advanced Technology for Materials Synthesis and Processing, School of Material Science and Engineering, Wuhan University of Technology, Wuhan, China |
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Abstract: | The microstructure, phase structure, ferroelectric, and dielectric properties of (1?x)Bi0.5Na0.5TiO3‐xNaNbO3 [(1?x)BNT‐xNN] ceramics conventionally sintered in the temperature range of 1080°C–1120°C were investigated as a candidate for capacitor dielectrics with wide temperature stability. Perovskite phase with no secondary impurity was observed by XRD measurement. With increasing NN content, (1?x)BNT‐xNN was found to gradually transform from ferroelectric (x = 0–0.05) to relaxor (x = 0.10–0.20) and then to paraelectric state (x = 0.25–0.35) at room temperature, indicated by P–I–E loops analysis, associated with greatly enhanced dielectric temperature stability. For the samples with x = 0.25–0.35, the temperature coefficient of capacitance (TCC) was found <11% in an ultra‐wide temperature range of ?60°C–400°C with moderate dielectric constant and low dielectric loss, promising for temperature stable capacitor applications. |
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