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基于PXI的光电瞄准设备自动检测系统
引用本文:邢冀川, 邢勇. 基于PXI的光电瞄准设备自动检测系统[J]. 红外技术, 2006, 28(3): 142-146. DOI: 10.3969/j.issn.1001-8891.2006.03.005
作者姓名:邢冀川  邢勇
作者单位:北京理工大学,信息科学技术学院,北京,100081;北京理工大学,信息科学技术学院,北京,100081
摘    要:光电瞄准自动检测系统是在PXI测试总线技术的基础上,有机地结合计算机技术和虚拟仪器测量技术,研制开发出的新一代检测系统.检测系统采用了PXI总线技术和规范的系统结构框架,通过选取M公司的PXI-1010混合机箱、PXI-8187主控制器、SCXI-1130矩阵开关、SCXI-1167继电器驱动模块、PXI-6509数字I/O、PXI-6229数据采集、PXI-4070数字万用表、PXI-5122数字化仪功能模块以及EXC公司的DAS-429cPCI/Mx、Condor公司基于cPCI的MIL-STD-1553和DDC公司的SB-36200IX模块,并利用LabVIEW开发工具开发出检测系统,而且还解决了PXI模块硬件及驱动程序与被测产品匹配问题,实现了基于PXI虚拟仪器的软面板技术.该检测系统是根椐标准的数据采集--信号分析与处理--输出及显示的结构模型而建立的,实现了光电瞄准系统数据的实时采集、处理和显示.光电瞄准自动检测系统样机实现了产品的自动化检测,具有一定的技术先进性.

关 键 词:光电瞄准  PXI总线  自动检测系统
文章编号:1001-8891(2006)03-0142-05
收稿时间:2005-07-29
修稿时间:2005-07-29

PXI- based Automatic Testing System for Electro-optic Aiming Device
XIN Ji-chuan, XIN Yong. PXI- based Automatic Testing System for Electro-optic Aiming Device[J]. Infrared Technology , 2006, 28(3): 142-146. DOI: 10.3969/j.issn.1001-8891.2006.03.005
Authors:XIN Ji-chuan  XIN Yong
Affiliation:Beijing Institute of Technology, Beijing 100081, China
Abstract:A new generation automatic testing system for electro-optic aiming was presentea. It is developed on the basis of PXI bus technology and combined with PC, digital port and instrument measurement technology. The testing system adopts PXI bus technology and standard system architecture. By using proper PXI-1010 hybird chasis, PXI-8187 main controller, SCXI-I130 matrix switch, SCXI-1167 relay driver, PXI-6509 digital I/O, PXI-6229 DAQ, PXI-4070 FlexDMM, PXI-5122 digitizer, and EXC DAS-429cPCI/Mx, Condor cPCI MIL-STD-1553, and DDC SB-36200IX module, and with LabVIEW developed enviorment, product adapter is designed and the solution to the problem of matching between the PXI-based modules, their drivers and tested products has been found. The soft-panel technology of PXI-based virtual instrument is realized. The testing system is created on the standard model of data acquiring-signal analyzing and processing, output and display, and the real time data acquisition and display of the electro-optic aiming system is realized. This automatic testing system for electro-optic aiming system has been applied to the automatic test of certain product. The result shows that the technology is fairly advanced.
Keywords:electro-optic aiming   PXI bus   automatic testing system
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