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Topotactic Metal–Insulator Transition in Epitaxial SrFeOx Thin Films
Authors:Amit Khare  Dongwon Shin  Tae Sup Yoo  Minu Kim  Tae Dong Kang  Jaekwang Lee  Seulki Roh  In‐Ho Jung  Jungseek Hwang  Sung Wng Kim  Tae Won Noh  Hiromichi Ohta  Woo Seok Choi
Affiliation:1. Department of Physics, Sungkyunkwan University, Suwon, South Korea;2. Center for Integrated Nanostructure Physics, Institute for Basic Science, Sungkyunkwan University, Suwon, South Korea;3. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA;4. Center for Correlated Electron Systems, Institute for Basic Science, Seoul National University, Seoul, South Korea;5. Department of Physics and Astronomy, Seoul National University, Seoul, South Korea;6. Department of Physics, Pusan National University, Busan, South Korea;7. Department of Mining and Materials Engineering, McGill University, Montreal, QC, Canada;8. Department of Energy Sciences, Sungkyunkwan University, Suwon, South Korea;9. Research Institute for Electronic Science, Hokkaido University, Sapporo, Japan
Abstract:Topotactic phase transformation enables structural transition without losing the crystalline symmetry of the parental phase and provides an effective platform for elucidating the redox reaction and oxygen diffusion within transition metal oxides. In addition, it enables tuning of the emergent physical properties of complex oxides, through strong interaction between the lattice and electronic degrees of freedom. In this communication, the electronic structure evolution of SrFeOx epitaxial thin films is identified in real‐time, during the progress of reversible topotactic phase transformation. Using real‐time optical spectroscopy, the phase transition between the two structurally distinct phases (i.e., brownmillerite and perovskite) is quantitatively monitored, and a pressure–temperature phase diagram of the topotactic transformation is constructed for the first time. The transformation at relatively low temperatures is attributed to a markedly small difference in Gibbs free energy compared to the known similar class of materials to date. This study highlights the phase stability and reversibility of SrFeOx thin films, which is highly relevant for energy and environmental applications exploiting the redox reactions.
Keywords:electronic structures  optical spectroscopy  perovskite oxides  thin films  topotactic phase transformation
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