| 图形分析法求半导体激光器端面减反膜的有效反射率 |
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| 引用本文： | 李大义 陈建国. 图形分析法求半导体激光器端面减反膜的有效反射率[J]. 激光技术, 1998, 22(5): 257-261 |
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| 作者姓名： | 李大义 陈建国 |
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| 作者单位： | 1.四川大学光电系, 成都, 610064 |
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| 摘 要： | 采用图解的方法,对镀制在半导体激光二极管(LD)端面的单层减反射膜的实际效果进行了分析.研究表明:在减反膜的反射率曲线的谱线宽度有限的情况之下,LD镀膜面上的有效反射率Reff一般均高于反射率曲线的最小值Rmin;对LD来说,存在着一个最佳波长λopt,当反射率曲线的最小值所处的波长λf与之相等时,Reff最接近Rmin.
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| 关 键 词： | 图形分析 半导体激光器 减反膜 有效反射率 |
| 收稿时间： | 1997-10-30 |
| 修稿时间： | 1998-01-18 |
Extracting effective reflectivity at AR coated diode facets using graphical analysis method |
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| Li Dayi,Chen Jianguo,Zhou Xiaohong,Lu Yucun. Extracting effective reflectivity at AR coated diode facets using graphical analysis method[J]. Laser Technology, 1998, 22(5): 257-261 |
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| Authors: | Li Dayi Chen Jianguo Zhou Xiaohong Lu Yucun |
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| Abstract: | In terms of graphical analysis method,the effective reflectivity of antireflection film deposited on the facet of semiconductor laser diode has been studied.The results show,if the spectral width of reflective curve of the antireflective film is finite,the reflectivity is generally greater than the minimum of reflectivity curve.It is possible to minimize the effective reflectivity through carefully choosing the wavelength at which the reflectivity curve reaches its minimum. |
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| Keywords: | graphical analysis semiconductor laser antireflection coating effective reflectivity |
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