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圆锥扫描中波红外光学系统的参数检测
引用本文:贺文俊,付跃刚,余锟,王加科,欧阳名钊. 圆锥扫描中波红外光学系统的参数检测[J]. 红外与激光工程, 2013, 42(7): 1783-1787
作者姓名:贺文俊  付跃刚  余锟  王加科  欧阳名钊
作者单位:1.长春理工大学 光电工程学院,吉林 长春 130022;
摘    要:介绍了圆锥扫描中波红外光学系统的参数检测的方法和基本原理,探讨了测试系统的调校方法,并针对系统装调和测试过程中成像不理想的问题,利用FRED软件进行了杂散光分析。通过分析发现,红外平行光管上的星孔基片上的高反金属膜产生的杂散光是造成弥散斑不清晰的主要原因,通过紧贴星孔外表面安装一个同心云母片抑制了该杂散光。此外,若圆锥扫描中波红外光学系统的校正镜镀膜透过率不够高,则会在红外探测器焦平面的4个角上产生规则形状的杂散光,可以在图像处理时通过软件程序算法来剔除其影响。最后进行了精度测试,测试结果表明:所研制的圆锥扫描中波红外光学系统的参数检测系统满足各项精度指标要求。

关 键 词:圆锥扫描   红外光学   杂散光分析   精度测试
收稿时间:2012-11-05

Parameters measurement of conical scanning MWIR optical system
He Wenjun , Fu Yuegang , Yu Kun , Wang Jiake , Ouyang Mingzhao. Parameters measurement of conical scanning MWIR optical system[J]. Infrared and Laser Engineering, 2013, 42(7): 1783-1787
Authors:He Wenjun    Fu Yuegang    Yu Kun    Wang Jiake    Ouyang Mingzhao
Affiliation:1.School of Opto-electronic Engineering,Changchun University of Science and Technology,Changchun 130022,China;2.Shanghai Institute of Aerospace Control,Shanghai 200233,China
Abstract:The parameters measurement method and operating principle of the conical scanning MWIR optical system were introduced. The adjustment methods of the measurement system were discussed, and the stray light analysis had been done by using the FRED software in allusion to the no ideal imaging. After analysis of the spread spot, the blur was introduced from the stray light of high reflection metal coating on pinhole substrate of infrared collimator. The stray light was restricted effectively by co-centered mica plate close to the substrate. In addition, if the infrared under tested correcting lens coating transmission was not high enough, there would be regular shape stray light at four corner of infrared detector. This kind of influence could be eliminated with image process program. Finally, the accuracy of the parameters measurement system for the conical scanning MWIR optical system was practical tested, and the results showed that the accuracy met the requirement.
Keywords:conical scanning  MWIR  stray light analysis  accuracy testing
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