Interfacial reaction and elemental redistribution in Sn3.0Ag0.5Cu-xPd/immersion Au/electroless Ni solder joints after aging

Sn3.0Ag0.5Cu solder doped with 0, 100, and 500 ppm Pd was reflowed with electroless Ni/immersion Au substrate. As Pd concentration increased in the solder, formation and growth of (Cu,Ni)₆Sn₅ were suppressed. After thermal aging, Cu₄Ni₂Sn₅ and Cu₅NiSn₅ were observed at interface of Sn3.0Ag0.5Cu-xPd/Au/Ni systems. As compared to Cu₄Ni₂Sn₅, more Pd dissolved in Cu₅NiSn₅. In addition, Pd doping enhanced the growth of Cu₄Ni₂Sn₅ and slowed the formation of Cu₅NiSn₅, which would stabilize the intermetallic compound. Based on quantitative analysis by field emission electron probe microanalyzer, the correlation between Pd doping and elemental redistribution in solder joints was probed and discussed. This study described a possible mechanism of the formation of different intermetallic compounds in Pd-doped lead-free solder.     

Low cycle fatigue behavior of a eutectic 80Au/20Sn solder alloy

The eutectic 80Au/20Sn solder alloy is widely used in high power electronics and optoelectronics packaging. In this study, low cycle fatigue behavior of a eutectic 80Au/20Sn solder alloy is reported. The 80Au/20Sn solder shows a quasi-static fracture characteristic at high strain rates, and then gradually transforms from a transgranular fracture (dominated by fatigue damage) to intergranular fracture (dominated by creep damage) at low strain rates with increasing temperature. Coffin-Manson and Morrow models are proposed to evaluate the low cycle fatigue behavior of the 80Au/20Sn solder. Besides, the 80Au/20Sn solder has enhanced fatigue resistance compared to the 63Sn/37Pb solder.     

Wetting Behaviors and Interfacial Reaction between Sn-10Sb-5Cu High Temperature Lead-free Solder and Cu Substrate

Sn-10Sb-5Cu lead-free solder was fabricated for high temperature application in electronic package. Wetting behaviors and interfacial reaction between such a high temperature lead-free solder and Cu substrate were investigated and compared with those of 95Pb-Sn solder. The results showed that the wetting properties of Sn-10Sb-5Cu solder are superior to those of 95Pb-Sn solder in maximum wetting force, wetting time and wetting angle in the temperature range of 340-400 ℃. However, the surface of the Sn-10Sb-5...     

Interaction Kinetics between Sn-Pb Solder Droplet and Au/Ni/Cu Pad

The interracial phenomena of the Sn-Pb solder droplet on and needle-like AuSn4 are formed at the interface after Au/Ni/Cu pad are investigated. A continuous AuSn2 the liquid state reaction （soldering）. The interracial reaction between the solder and Au layer continues during solid state aging with AuSn4 breaking off from the interface and felling into the solder. The kinetics of Au layer dissolution and diffusion into the solder during soldering and aging is analyzed to elucidate intermetallic formation mechanism at the solder/Au pad interface. The concentration of Au near the solder/pad interface is identified to increase and reach the solubility limit during the period of liquid state reaction. During solid state reaction, the thickening of Au-Sn compound is mainly controlled by element diffusion.     

三价铈离子掺杂氯化钾的光致发光性能

采用水热蒸发法制备了KCl∶Ce3+荧光粉。测量并分析了材料在室温下的真空紫外激发光谱及相应的发射光谱。结果表明激发谱显示6个峰,峰位分别为149、194、206、219、233和251nm。其中149nm的激发峰是基质吸收引起的;194、206、219、233和251nm是Ce3+离子的4f→5d跃迁引起的。发射峰显示双峰结构,峰位分别是311和326nm。此峰对应于Ce3+离子的5d→4f(2F5/2,2F7/2)跃迁。     

Si3N4陶瓷/Nb/Cu/Ni/Inconel 600界面反应层形成机制研究

观察分析了Si3N4陶瓷/Nb/Cu/Ni/Inconel600界面处反应层的形貌、元素分布、反应层中的相结构、界面反应以及反应层的生长规律,研究了Si3N4陶瓷/Nb/Cu/Ni/Inconel600界面处反应层的形成机制.研究结果表明:在连接过程中,Cu层首先熔化,Nb、Ni向液态Cu中扩散溶解形成Cu-Nb-Ni合金,液态合金中的Nb和Ni向Si3N4表面扩散聚集并与Si3N4反应形成反应层;Si3N4侧的反应层主要物相是NbN和Nb、Ni的硅化物,Ni基合金侧反应相主要是NbNi3和Cu-Ni合金;在连接温度为1403 K的条件下,随着连接时间的增加,界面反应层厚度先快速增加,再缓慢增加.     

Different Diffusion Behavior of Cu and Ni Undergoing Liquidesolid Electromigration

The diffusion behavior of Cu and Ni atoms undergoing liquidesolid electromigration（L-S EM） was investigated using Cu/Sn/Ni interconnects under a current density of 5.0 103A/cm2 at 250℃. The flowing direction of electrons significantly influences the cross-solder interaction of Cu and Ni atoms, i.e., under downwind diffusion, both Cu and Ni atoms can diffuse to the opposite interfaces; while under upwind diffusion,Cu atoms but not Ni atoms can diffuse to the opposite interface. When electrons flow from the Cu to the Ni, only Cu atoms diffuse to the opposite anode Ni interface, resulting in the transformation of interfacial intermetallic compound（IMC） from Ni3Sn4into（Cu,Ni）6Sn5and further into [（Cu,Ni）6Sn5t Cu6Sn5], while no Ni atoms diffuse to the opposite cathode Cu interface and thus the interfacial Cu6Sn5 remained.When electrons flow from the Ni to the Cu, both Cu and Ni atoms diffuse to the opposite interfaces,resulting in the interfacial IMC transformation from initial Cu6Sn5into（Cu,Ni）6Sn5and further into[（Cu,Ni）6Sn5t（Ni,Cu）3Sn4] at the anode Cu interface while that from initial Ni3Sn4into（Cu,Ni）6Sn5and further into（Ni,Cu）3Sn4at the cathode Ni interface. It is more damaging with electrons flowing from the Cu to the Ni than the other way.     

Intermetallic compound formation between lead-free solders (Sn) and Cu or Ni electrodes

A kinetic model based on the principle of maximum degradation rate of the total system free energy, MDR law using thermodynamic data, is proposed and successfully applied to the selection of the first intermetallic compound (IMC) phase in Cu/Sn and Ni/Sn diffusion couples. The first phases predicted with this model for Cu/Sn and Ni/Sn are Cu₆Sn₅ and Ni₃Sn₄, respectively, resulting in good agreement with experimental observations.     

Interfacial reactions of Sn-3.5% Ag and Sn-3.5% Ag-0.5% Cu solder with electroless Ni/Au metallization during multiple reflow cycles

The increasing industry awareness of lead-free activities has prompted original equipment manufacturers and suppliers to investigate lead-free solder systems in detail. The reliability of lead-free solders has been studied a lot recently, but the knowledge of it is still incomplete and many issues related to them are under heavy debate. In this study, the interfacial reactions of Sn-3.5Ag and Sn-3.5Ag-0.5Cu (wt.%) solders with Cu/Ni(P)/Au ball grid array (BGA) pad metallization were systematically investigated after multiple reflows. The peak reflow temperature was fixed at 260°C. It was found that relatively high consumption of Ni(P) was observed in the case of Sn-3.5%Ag solder alloys during multiple reflow cycles. A white layer of P rich Ni-Sn compound was observed above the dark Ni₃P layer for Sn-3.5%Ag solder after several reflows. It was noticed that the mean thickness of the intermetallics and the dark P-rich Ni layer at the interface was decreased just by adding 0.5% Cu in Sn-3.5%Ag solder alloy with less overall interfacial reaction at the solder joint.     

Effects of Co and Ni addition on reactive diffusion between Sn–3.5Ag solder and Cu during soldering and annealing

The reactive diffusion between Sn–Ag solders and Cu was experimentally examined during soldering and isothermal annealing. Three sorts of solders with compositions of Sn–3.5Ag, Sn–3.5Ag–0.1Ni and Sn–3.5Ag–0.1Co were used for the experiment. Each solder was soldered on a Cu plate at 523 K (250 °C) for 1–60 s in a pure nitrogen gas, and then the solder/Cu diffusion couple was isothermally annealed at 423 K (150 °C) for 168–1008 h. Due to soldering, only Cu₆Sn₅ is formed at the interface in each diffusion couple. On the other hand, Cu₃Sn is produced between Cu₆Sn₅ and Cu owing to the isothermal annealing. The composition of Cu₆Sn₅ is (Cu_0.8Ni_0.2)₆Sn₅ and (Cu_0.93Ni_0.07)₆Sn₅ on the solder and Cu₃Sn sides, respectively, in the (Sn–3.5Ag–0.1Ni)/Cu diffusion couple, and it is (Cu_0.9Co_0.1)₆Sn₅ and (Cu_0.99Co_0.01)₆Sn₅ on the solder and Cu₃Sn sides, respectively, in the (Sn–3.5Ag–0.1Co)/Cu diffusion couple. Different rate-controlling processes were suggested for the (Sn–3.5Ag)/Cu, (Sn–3.5Ag–0.1Ni)/Cu and (Sn–3.5Ag–0.1Co)/Cu diffusion couples. Finally, thermodynamic models were herein adopted to explore influences of the additives on the thermodynamic interaction of the component elements and the driving force for the growth of intermetallics.