A Jitter-Tolerance-Enhanced CDR Using a GDCO-Based Phase Detector

A jitter-tolerance-enhanced 10 Gb/s clock and data recovery (CDR) circuit is presented. The proposed architecture cascades 2 half-rate CDRs with different loop bandwidth to relax the design bottleneck and the predicted jitter tolerance can be enhanced without sacrificing the jitter transfer. By using a gated digital-controlled oscillator (GDCO), the proposed GDCO-based phase detector may reduce the cost of this architecture and achieve a wide linear range. This CDR circuit has been fabricated in a 0.13 mum CMOS technology and consumes 60 mW from a 1.5 V supply. It occupies an active area of 0.36 mm². The measured rms jitter is 0.96 ps and the peak-to-peak jitter is 7.11 ps for a 10 Gb/s 2⁷-1 PRBS. The measured bit error rate for a 10 Gb/s 2⁷-1PRBS is less than 10^-12.     

SiGe clock and data recovery IC with linear-type PLL for 10-Gb/sSONET application

An integrated 10 Gb/s clock and data recovery (CDR) circuit is fabricated using SiGe technology, It consists of a linear-type phase-locked loop (PLL) based on a single-edge version of the Hogge phase detector, a LC-tank voltage-controlled oscillator (VCO) and a tri-state charge pump. A PLL equivalent model and design method to meet SONET jitter requirements are presented. The CDR was tested at 9.529 GB/s in full operation and up to 13.25 Gb/s in data recovery mode. Sensitivity is 14 mV_pp at a bit error rate (BER)=10^-9 . The measured recovered clock jitter is less than 1 ps RMS. The IC dissipates 1.5 W with a -5 V power supply     

A 5.75 to 44 Gb/s Quarter Rate CDR With Data Rate Selection in 90 nm Bulk CMOS

This paper presents a quarter-rate clock and data recovery (CDR) circuit for plesiochronous serial I/O-links. The 2$times$-oversampling phase-tracking CDR, implemented in 90$,$nm bulk CMOS technology, covers the whole range of data rates from 5.75 to 44 Gb/s realized in a single IC by the novel feature of a data rate selection logic. Input data are sampled with eight parallel differential master-slave flip-flops, where bandwidth enhancement techniques were necessary for 90 nm CMOS. Precise and low-jitter local clock phases are generated by an analog delay-locked loop. These clock phases are aligned to the incoming data by four parallel phase rotators. The phase-tracking loop of the CDR is realized as a digital delay-locked loop and is therefore immune against process tolerances. The CDR is able to track a maximum frequency deviation of ${pm }{hbox{615~ppm}}$ between incoming data and a local reference clock and fulfills the extended XAUI jitter tolerance mask. A bit error rate ${≪} hbox{10}^{-12}$ was verified up to 38 Gb/s using a 2$ ^{7} -$1 PRBS pattern. With a low power consumption per data rate of only 5.74 mW/(Gb/s) the CDR meets the specifications of the International Technology Roadmap for Semiconductors for 90$~$nm CMOS serial I/O-links at the maximal data rate of 44 Gb/s. The CDR occupies a chip area of 0.2 ${hbox{mm}}^{2}$ .      

A Wide-Tracking Range Clock and Data Recovery Circuit

A hybrid analog-digital quarter-rate clock and data recovery circuit (CDR) that achieves a wide-tracking range and excellent frequency and phase tracking resolution is presented in this paper. A split-tuned analog phase-locked loop (PLL) provides eight equally spaced phases needed for quarter-rate data recovery and the digital CDR loop adjusts the phase of the PLL output clocks in a precise manner to facilitate plesiochronous clocking. The CDR employs a second-order digital loop filter and combines delta-sigma modulation with the analog PLL to achieve sub-picosecond phase resolution and better than 2 ppm frequency resolution. A test chip fabricated in a 0.18 mum CMOS process achieves BER <10^-12 and consumes 14 mW power while operating at 2 Gb/s. The tracking range is greater than plusmn5000 ppm and plusmn2500 ppm at 10 kHz and 20 kHz modulation frequencies, respectively, making this CDR suitable for systems employing spread-spectrum clocking.     

A 3.2 Gb/s CDR Using Semi-Blind Oversampling to Achieve High Jitter Tolerance

A hybrid CDR is presented that embeds a 5 blind-oversampling CDR within a conventional phase-tracking CDR. This hybrid CDR has a jitter tolerance that is the product of the individual jitter tolerances. In this implementation, the jitter tolerance of a phase-tracking CDR alone is increased by a factor of 32 at frequencies below its loop filter's bandwidth, while maintaining the high-frequency jitter tolerance of a 5x blind-oversampling CDR. Measured data from a 0.11 mum CMOS test chip at 2.4 Gb/s confirm a 200 UI peak-to-peak jitter tolerance for a 200 kHz jitter. The test chip operates from 1.9 Gb/s to 3.5 Gb/s with a BER less than 10^-11, consuming 115 mW at 2.4 Gb/s.     

Equalization and Clock and Data Recovery Techniques for 10-Gb/s CMOS Serial-Link Receivers

Two equalizer filter topologies and a merged equalizer/CDR circuit are described that operate at 10 Gb/s in 0.13-mum CMOS technology. Using techniques such as reverse scaling, passive peaking networks, and dual- and triple-loop adaptation, the prototypes adapt to FR4 trace lengths up to 24 inches. The equalizer/CDR circuit retimes the data with a bit error rate of 10^-13 while consuming 133 mW from a 1.6-V supply.     

A 10-Gb/s CMOS CDR and DEMUX IC With a Quarter-Rate Linear Phase Detector

This paper presents a 10-Gb/s clock and data recovery (CDR) and demultiplexer IC in a 0.13-mum CMOS process. The CDR uses a new quarter-rate linear phase detector, a new data recovery circuit, and a four-phase 2.5-GHz LC quadrature voltage-controlled oscillator for both wide phase error pulses and low power consumption. The chip consumes 100 mA from a 1.2-V core supply and 205 mA from a 2.5-V I/O supply including 18 preamplifiers and low voltage differential signal (LVDS) drivers. When 9.95328-Gb/s 2³¹-1 pseudorandom binary sequence is used, the measured bit-error rate is better than 10^-15 and the jitter tolerance is 0.5UIpp, which exceeds the SONET OC-192 standard. The jitter of the recovered clock is 2.1 psrms at a 155.52MHz monitoring clock pin. Multiple bit rates are supported from 9.4 Gb/s to 11.3 Gb/s     

A 0.2-mW 2-Mb/s Digital Transceiver Based on Wideband Signaling for Human Body Communications

This paper presents a low-power wideband signaling (WBS) digital transceiver for data transmission through a human body for body area network applications. The low-power and highspeed human body communication (HBC) utilizes a digital transceiver chip based on WBS and adopts a direct-coupled interface (DCI) which uses an electrode of 50-Omega impedance. The channel investigation with the DCI identities an optimum channel bandwidth of 10 kHz to 100 MHz. The WBS digital transceiver exploits a direct digital transmitter and an all-digital clock and data recovery (CDR) circuit. To further reduce power consumption, the proposed CDR circuit incorporates a low-voltage digitally-controlled oscillator and a quadratic sampling technique. The WBS digital transceiver chip with a 0.25-mum standard CMOS technology has 2-Mb/s data rate at a bit error rate of 1.1 times 10^-7, dissipating only 0.2 mW from a 1-V supply generated by a 1.5-V battery.     

NMOS IC's for clock and data regeneration in gigabit-per-secondoptical-fiber receivers

The design and performance of two essential analog circuits in optical-fiber receivers is described. A time-interleaved decision circuit is capable of regenerating 35-mV nonreturn-to-zero (NRZ) data inputs to full logic levels at 1.1 Gb/s with 10^-11 bit error rate (BER), and a phase-locked loop (PLL) extracts the clock from a 2 ²³ long pseudorandom sequence at 1.5 Gb/s with 13-ps r.m.s. jitter. The two circuits have been implemented as 1-μm NMOS ICs, and in their core area dissipate 200 and 350 mW, respectively     

PLL design technique by a loop-trajectory analysis taking decision-circuit phase margin into account for over-10-Gb/s clock and data recovery circuits

A design technique for an over-10-Gb/s clock and data recovery (CDR) IC provides good jitter tolerance and low jitter. To design the CDR using a PLL that includes a decision circuit with a certain phase margin affecting the pull-in performance, we derived a simple expression for the pull-in range of the PLL, which we call the "limited pull-in range," and used it for the pull-in performance evaluation. The method allows us to quickly and easily compare the pull-in performance of a conventional PLL with a full-rate clock and a PLL with a half-rate clock, and we verified that the half-rate PLL is advantageous because of its wider frequency range. For verification of the method, we fabricated a half-rate CDR with a 1:16 DEMUX IC using commercially available Si bipolar technology with f/sub T/=43 GHz. The half-rate clock technique with a linear phase detector, which is adopted to avoid using the binary phase detector often used for half-rate CDR ICs, achieves good jitter characteristics. The CDR IC operates reliably up to over 15 Gb/s and achieves jitter tolerance with wide margins that surpasses the ITU-T specifications. Furthermore, the measured jitter generation is less than 0.4 ps rms, which is much lower than the ITU-T specification. In addition, the CDR IC can extract a precise clock signal under harsh conditions, such as when the bit error rate of input data is around 2/spl times/10/sup -2/ due to a low-power optical input of -24 dBm.     

A 2.5-3.125-Gb/s quad transceiver with second-order analog DLL-based CDRs

This paper describes a 2.5-3.125-Gb/s quad transceiver with second-order analog delay-locked loop (DLL)-based clock and data recovery (CDR) circuits. A phase-locked loop (PLL) is shared between receive (RX) and transmit (TX) chains. On each RX channel, an amplifier with user-programmable input equalization precedes the CDR. Retimed data then goes to an 1:8/1:10 deserializer. On the TX side, parallel data is serialized into a high-speed bitstream with an 8:1/10:1 multiplexer. The serial data is introduced off-chip through a high-speed CML buffer having single-tap pre-emphasis. Proposed DLL-based CDR can tolerate large frequency offsets with no jitter tolerance degradation due to its second-order PLL-like nature. Also, this study introduces an improved charge-pump and an improved phase-interpolator. Fabricated in a 0.15-/spl mu/m CMOS process, the 1.9-mm/sup 2/ transceiver front-end operates from a single 1.2-V supply and consumes 65-mW/channel of which 32 mW is due to the CDR. CDR jitter generation and high-frequency jitter tolerance are 5.9 ps-rms and 0.5 UI, respectively, for 3.125 Gb/s, 2/sup 23/-1 PRBS input data with 800-ppm frequency offset.     

2.5Gb/s/ch 0.18μm CMOS数据恢复电路

设计了一个应用于SFI-5接口的2.5Gb/s/ch数据恢复电路.应用一个延迟锁相环,将数据的眼图中心调整为与参考时钟的上升沿对准,因而同步了并行恢复数据,并降低了误码率.采用TSMC标准的0.18μm CMOS工艺制作了一个单通道的2.5Gb/s/ch数据恢复电路,其面积为0.46mm2.输入231-1伪随机序列,恢复出2.5Gb/s数据的均方抖动为3.3ps.在误码率为10-12的条件下,电路的灵敏度小于20mV.     

A CMOS mixed-signal clock and data recovery circuit for OIF CEI-6G+ backplane transceiver

A CMOS low-power mixed-signal clock and data recovery circuit is presented in this paper. It is designed for OIF CEI-6G+ LR backplane transceiver, and consists of a phase detector, loop filter, phase control logic, and phase interpolator. A unique subsampled architecture makes it possible for a low-power mixed-signal clock recovery loop running at a rate of 6 Gb/s. The proposed architecture has data pattern independent loop bandwidth. Fabricated in a 0.13-/spl mu/m CMOS technology in an area of 280/spl times/100 /spl mu/m/sup 2/, the clock and data recovery loop exhibits a frequency tracking range up to 2000 ppm. The bit error rate is less than 10/sup -12/ with a pseudorandom bit sequence of length 2/sup 31/-1. The power dissipation is 24 mW for clock and data recovery circuits from a single 1.2-V supply.     

A 5-Gb/s CDR Circuit With Automatically Calibrated Linear Phase Detector

This paper presents a 5-Gb/s clock and data recovery (CDR) circuit which implements a calibration circuit to correct static phase offsets in a linear phase detector. Static phase offsets directly reduce the performance of CDR circuits as the incoming data is not sampled at the center of the eye. Process nonidealities can cause static phase offsets in linear phase detectors by adversely affecting the circuits in a way which is difficult to design for, making calibration an attractive solution. Both the calibration algorithm and test chip implementation are described and measured results are presented. The CDR circuit was fabricated in a 0.18-mum, six metal layer standard CMOS process. With a pseudorandom bit sequence of 2⁷ - 1 calibration improved the measured bit error rate from 4.6 x 10^-2 to less than 10^-13.     

A semi-digital delay-locked loop using an analog-based finite state machine

This brief describes a low-power full-rate semi-digital delay-locked loop (DLL) architecture using an analog-based finite state machine (AFSM) and a polyphase filter. The AFSM architecture uses low-power analog blocks to map high-frequency loop feedback information to low frequency, thus reducing the total power required for digital signal processing and for the macro as a whole. The polyphase filter generates full-rate multiphase outputs for a phase rotator, hence a reference clock of the semi-digital DLL can be generated by any reference source including a phase-locked loop with an LC voltage-controlled oscillator. The prototype semi-digital DLL in 0.12-/spl mu/m CMOS exhibits less than 10/sup -12/ bit error rate at 3.2 Gb/s consuming 60 mW.     

A Low-Power, Fast Acquisition, Data Recovery Circuit With Digital Threshold Decision for SFI-5 Application

An all-digital clock and data recovery (CDR) with a digital threshold decision updating technique for SFI-5 application is presented in this paper. The CDR updates its decision upon the phase error reaching a threshold value by examining the phase errors in the data bits within an examining window at the baud rate. High jitter tolerance performance is obtained and the phase acquisition can be achieved within one baud period. The proposed CDR is embodied with 900 transistors and the core CDR consumes 5 mW with 1.2 V supply at 2.5 Gb/s. Measured results verify the digital threshold decision technique and its low-complexity implementation for SFI-5 application.      

A 40–44 Gb/s 3× Oversampling CMOS CDR/1:16 DEMUX

A CMOS CDR and 1:16 DEMUX fabricated in a low-cost 90 nm bulk CMOS process operates at 40-44 Gb/s and dissipates 910 mW. A quarter-rate hybrid phase-tracking/3times blind-oversampling architecture is used to improve jitter tolerance, reduce the need for high-power CML circuits, and enable frequency acquisition without a reference clock. Input data are sampled using a 24-phase distributed VCO, and a digital CDR recovers 16 bits and a 2.5 GHz clock from 48 demultiplexed samples spanning 16 UI. Conformance to the ITU-T G.8251 jitter tolerance mask (BER <10^-12 with a 2³¹-1 PRBS source) is demonstrated using both an on-chip and an external BERT.     

A Single-Pair Serial Link for Mobile Displays With Clock Edge Modulation Scheme

A low-power, single-channel clock-edge modulated serial link has been fabricated in a standard 0.18-mum CMOS technology. The link core size is 343 times 188 mum² for the transmitter and 173 times 83 mum² for the receiver. The link consumes 3.12 mW when operating at 270 Mb/s with a 1.2-V supply. The proposed link transfers all necessary signals between a graphic processor and a mobile display device over a single pair channel, thereby greatly saving the power and cost of the existing full swing parallel lines. The proposed clock edge modulation (CEM) encoding can keep the channel DC-balanced without an additional bit overhead. Since a clock edge is present for each bit, an external reference clock is not needed and its operating frequency can be varied without the possibility of harmonic locking typically found in a referenceless clock and data recovery circuit. A simple DLL-based CEM decoder is described that recovers the data with low power consumption and high jitter tolerance. An analysis of the jitter tolerance to sinusoidal jitter is included along with measured data. The measurement results show jitter tolerance of 20 UI_P-P with 1-MHz sinusoidal jitter. The use of a push-pull voltage-mode driver further reduces the power consumption.     

A 40 Gb/s Clock and Data Recovery Module with Improved Phase‐Locked Loop Circuits

A 40 Gb/s clock and data recovery (CDR) module for a fiber‐optic receiver with improved phase‐locked loop (PLL) circuits has been successfully implemented. The PLL of the CDR module employs an improved D‐type flip‐flop frequency acquisition circuit, which helps to stabilize the CDR performance, to obtain faster frequency acquisition, and to reduce the time of recovering the lock state in the event of losing the lock state. The measured RMS jitter of the clock signal recovered from 40 Gb/s pseudo‐random binary sequence (2³¹‐1) data by the improved PLL clock recovery module is 210 fs. The CDR module also integrates a 40 Gb/s D‐FF decision circuit, demonstrating that it can produce clean retimed data using the recovered clock.     

A 14-mW 6.25-Gb/s Transceiver in 90-nm CMOS

This paper describes a 6.25-Gb/s 14-mW transceiver in 90-nm CMOS for chip-to-chip applications. The transceiver employs a number of features for reducing power consumption, including a shared LC-PLL clock multiplier, an inductor-loaded resonant clock distribution network, a low- and programmable-swing voltage-mode transmitter, software-controlled clock and data recovery (CDR) and adaptive equalization within the receiver, and a novel PLL-based phase rotator for the CDR. The design can operate with channel attenuation of -15 dB or greater at a bit-error rate of 10^-15 or less, while consuming less than 2.25 mW/Gb/s per transceiver.