A 1.5 V full-swing BiCMOS dynamic logic gate circuit suitable forVLSI using low-voltage BiCMOS technology

This paper presents a 1.5 V full-swing BiCMOS dynamic logic gate circuit, based on a dynamic pull-down BiPMOS configuration, suitable for VLSI using low-voltage BiCMOS technology. With an output load of 0.2 pf, the 1.5 V full-swing BiCMOS dynamic logic gate circuit shows a more than 1.8 times improvement in speed as compared to the CMOS static one     

BiCMOS logic testing

With the anticipated growth of BiCMOS technology for high-performance ASIC design, the issue of testing takes on great significance. This paper addresses the testing of BiCMOS logic circuits. Since many different implementations of BiCMOS gates have been proposed, four representative ones are studied. The adequacy of stuck-at, quiescent current, and delay testing are examined based on circuit level faults. It is demonstrated that a large portion of the defects cannot be detected by common stuck-at or quiescent current tests since they manifest themselves as delay faults. By using the results presented, the test methodologies and the logic families can be ranked based on fault coverage. This ranking can then be used to help decide which BiCMOS solution is proper for a given application     

BiCMOS logic circuit for single-battery operation

A novel BiCMOS logic circuit is described that provides highspeed rail-to-rail operation with only one battery cell (1-1.5 V). The proposed circuit utilises a novel pull-down scheme that involves bootstrapping the base of the pull-down p-n-p bipolar junction transistor to a negative potential during the pull-down transient period. Circuit simulations have shown that the proposed circuit outperforms the transient-saturation full-swing BiCMOS and the bootstrapped bipolar circuits in terms of delay, power and cross-over capacitance for all simulated supply voltages     

A BiCMOS wired-OR logic

This paper proposes a BiCMOS wired-OR logic for high-speed multiple input logic gates. The logic utilizes the bipolar wired-OR to circumvent the use of a series connection of MOS transistors. The BiCMOS wired-OR logic was found to be the fastest compared with such conventional gates as CMOS NOR, BiCMOS multiemitter logic and CMOS wired-NOR logic, when the number of inputs was more than four and the supply voltage was 3.3 V. The BiCMOS wired-OR logic was also determined to be the fastest of the four when the fan-out number was below 20 and the number of inputs was eight. In addition, the speed was more than twice as faster when the fan-out number was less than 10. The BiCMOS wired-OR logic was applied to a 64-b 2-stage carry look-ahead adder, and was fabricated with a 0.5-μm BiCMOS process technology. A critical path delay time of 3.1 ns from an input to a sum output was obtained at the supply voltage of 3.3 V. This is 35% faster than that of conventional BiCMOS adders     

BiCMOS nonthreshold logic for high-speed low-power applications

New high-speed low-power BiCMOS nonthreshold logic (BNTL) circuits are presented. These circuits offers a built-in CMOS and bipolar level conversion and are suitable for reduced power supply voltage. A 4-b carry lookahead generator (CLG) circuit is designed in BNTL, ECL, and CMOS using 0.8-μm BiCMOS technology. Circuit simulations show that this new logic provides speed comparable to or better than that provided by emitter-coupled logic (ECL) for lower power dissipation     

An ECL gate with improved speed and low power in a BiCMOS process

An emitter-coupled logic (ECL) gate exhibiting an improved speed-power product over the circuits presented in the past is described. The improvement is due to a combination of a push-pull output stage driven by a controlled current source, thus reducing the static and increasing the dynamic current. This circuit has better driving capabilities and improved speed, yet it uses an order of magnitude less power than a regular ECL gate. Due to its reduced power consumption, this gate allows for a higher level of integration of ECL logic. The realization of this circuit using a regular bipolar process is also possible     

A BiCMOS low-power current mode gate

A controllable BiCMOS low-power current mode logic (LPCML) gate is proposed. The LPCML can be controlled to operate in a high-power mode when its inputs and outputs are in transition. When the gate is idle, it is in a low-power mode and the circuit maintains its output levels with very little tail current. A circuit implementation of the LPCML is also reported with a discussion on its design considerations. A circuit implementation of the LPCML with conventional CML indicates that its delay is greater than that of CML by about 60%. The power consumption of LPCML is proportional to the time it spends in the high-power mode, and, hence, may be significantly lower than that of CML     

Active-pull-down nonthreshold logic BiCMOS circuits for high-speedlow-power applications

A new active-pull-down nonthreshold logic (APD-NTL) BiCMOS circuit is presented and its performance has been evaluated and compared to that of standard NTL gate. The circuit utilizes an NMOS active-pull-down emitter-follower stage. A first-order analysis has been conducted to demonstrate the NMOS-APD concept. Simulation results based on 0.6 μm BiCMOS technology indicate that at a power consumption of 1 mW/gate, the APD-NTL circuit offers 4× improvement in the load driving capability and 3.4× improvement in the speed compared to conventional NTL circuits for a load of 1 pF/gate and a logic swing of 800 mV     

Fused logic: improved universal element and a trainable and gate

A universal logic element is described whose performance is specified by fusing links. It is trained by presenting inputs specifying directly the minterms required in the final response. A trainable fused AND gate is also described which learns to respond to an input after being exposed to it.     

Analysis and optimization of BiCMOS gate circuits

A comprehensive view of an optimization strategy for BiCMOS gates is described. A simple gate delay model is proposed. BiCMOS gate delay, when optimized, is found to be expressed as A+B√F, where F is fanout and A and B are coefficients. Since the coefficients can be extracted by SPICE simulation, the delay prediction can be precise, while keeping the delay formula simple enough for circuit designers to derive useful expressions. A procedure for optimizing BiCMOS gates is studied. BiCMOS gate delay can be calculated quickly and optimized efficiently just by looking up a design table which is obtained from SPICE simulations. The procedure for making the design table is technology-independent. Once obtained, the design table can be applied to any design with the same device technology. A sizing strategy of cascaded BiCMOS buffers is derived from the simple delay model. In a 0.8 μm, 9 GHz, BiCMOS process, a BiCMOS-BiCMOS cascaded buffer is optimized when the scale-up factor between two consecutive stages is e ^2.3(≈10.0). A BiCMOS-CMOS cascaded buffer becomes the fastest when the scale-up factor, e^1.6(≈5.0), is employed. The optimization procedure and the sizing strategy can be used for several variants of the basic BiCMOS gate, because the delay model is based on basic circuit models for the variants     

3.3-V BiCMOS current-mode logic circuits for high-speed adders

New high-speed BiCMOS current mode logic (BCML) circuits for fast carry propagation and generation are described. These circuits are suitable for reduced supply voltage of 3.3-V. A 32-b BiCMOS carry select adder (CSA) is designed using 0.5-μm BiCMOS technology. The BCML circuits are used for the correct carry path for high-speed operation while the rest of the adder is implemented in CMOS to achieve high density and low power dissipation. Simulation results show that the BiCMOS CSA outperforms emitter coupled logic (ECL) and CMOS adders     

Noncomplementary BiCMOS logic and CMOS logic for low-voltage,low-power operation-a comparative study

This paper presents results of a comprehensive comparative study of six bipolar complementary metal-oxide-semiconductor (BiCMOS) noncomplementary logic design styles and two CMOS logic styles for low-voltage, low-power operation. These logic styles have been compared for switching power consumption and power efficiency (power-delay product). The examination offers two alternative approaches never used in other comparative studies. First, all BiCMOS-based styles are compared to low-power CMOS styles as opposed to a single conventional static CMOS style. Second, a low-power methodology has been used as opposed to performance methodology referred to in the previous logic comparisons. The styles examined are bootstrapped BiCMOS, bootstrapped full-swing BiCMOS, bootstrapped bipolar CMOS, Seng-Rofail's bootstrapped BiCMOS, modified full-swing BiCMOS, dynamic full-swing BiCMOS, double pass-transistor CMOS, and inverter-based CMOS. These design styles have been compared at various power supply voltages (0.9-3 V), with various output load capacitances (0.1-1 pF) at the frequency 50 MHz and temperature 27°C. The results clearly show which logic style is the most beneficial for which specific conditions     

Highly testable design of BiCMOS logic circuits

Most of the work reported in the literature to date on the testability of BiCMOS circuits has concentrated on fault characterization and the need for a suitable testing method that can address the peculiarities of BiCMOS circuits. The problem of adequately testing large BiCMOS logic networks remains open and complex. In this paper, we introduce a new design for testability technique for BiCMOS logic gates that results in highly testable BiCMOS logic circuits. The proposed design incorporates two features: a test charge/discharge path and built-in current sensing (BICS). The test charge/discharge path is activated only during testing and facilitates the testing of stuck-open faults using single test vectors. BICS facilitates testing of faults that cause excessive IDDQ. HSPICE simulation results show that the proposed design can detect stuck-open faults at a test speed of 10 MHz. Faults causing excessive IDDQ are detected by BICS with a detection time of 1 ns and a settling time of 2 ns. Impact of the proposed design on normal operation is minimal. The increase in propagation delay in normal operation is less than 3%. This compares very favorably with CMOS BICS reported in the literature, where the propagation delay increase was 20%, 14.4% respectively. The increase in the area is less than 15%     

A sub-2.0 V BiCMOS logic circuit with a BiCMOS charge pump

A BiCMOS logic circuit with very small input capacitance has been developed, which operates at low supply voltages. A High-beta BiCMOS (Hβ-BiCMOS) gate circuit which fully utilizes the bipolar transistor features achieves 10 times the speed of a CMOS gate circuit with the same input capacitance and operating at 3.3 V supply voltage. In order to lower the minimum supply voltage of Hβ-BiCMOS, a BiCMOS circuit configuration using a charge pump to pull up the output high level of the BiCMOS gate circuit is proposed. By introducing a BiCMOS charge pump, Hβ-BiCMOS achieves very high speed operation at sub-2.0 V supply voltage. It has also been demonstrated that only a very small number of charge pump circuits are required to drive a large number of Hβ-BiCMOS gate circuits     

A 1.5-V full-swing BiCMOS logic circuit

A BiCMOS logic circuit applicable to sub-2-V digital circuits has been developed. A transiently saturated full-swing BiCMOS (TS-FS-BiCMOS) logic circuit operates twice as fast as CMOS at 1.5-V supply. A newly developed transient-saturation technique, with which bipolar transistors saturate only during switching periods, is the key to sub-2-V operation because a high-speed full-swing operation is achieved to remove the voltage loss due to the base-emitter turn-on voltage. Both small load dependence and small fan-in dependence of gate delay time are attained with this technique. A two-input gate fabricated with 0.3-μm BiCMOS technology verifies the performance advantage of TS-FS-BiCMOS over other BiCMOS circuits and CMOS at sub 2-V supply     

A 76-MHz BiCMOS programmable logic sequencer

A BiCMOS programmable logic sequencer with a maximum operating frequency of 76 MHz at a power dissipation of 370 mW has been developed. The device is organized as 16 inputs, 48 product terms, and eight registered outputs. The excellent speed power performance and TTL/CMOS compatibility were realized by an optimized circuit design coupled with an advanced BiCMOS process. The process features 13-GHz bipolar transistors, 1- mu m CMOS, TiW fuses, poly resistors, three-layer metal, and single-layer polycide. Bipolar devices are used in areas that utilize their strengths such as high current drivers, small-signal sensing, and precise current sources. CMOS is used in other areas to conserve layout size and power.<>     

三值钟控传输门绝热逻辑电路研究

通过分析开关一信号理论和绝热电路工作原理及结构,提出三值钟控传输门绝热逻辑(Ternary Clocked Transmission Gate Adiabatic Logic,TCTGAL)电路设计方案.该方案利用NMOS管自举效应和CMOS-1atch结构对输出负载进行充放电,并通过NMOS管栅漏并接对输出降压限幅;...     

Merged BiCMOS logic to extend the CMOS/BiCMOS performance crossoverbelow 2.5-V supply

The authors discuss the merged BiCMOS (MBiCMOS) gate, a unique circuit configuration to improve BiCMOS gate performance at low supply voltages. MBiCMOS maintains a measured delay and power-delay advantage over CMOS into the 2-V supply range, in a simple four-device gate that does not require any change in the standard BiCMOS processing sequence. In a 2-μm technology, MBiCMOS outperforms CMOS down to a 2.6-V supply. Gates designed for fabrication in a 0.5-μm technology and simulated using measured device parameters indicate that MBiCMOS can be used to extend the performance crossover voltage to below 2 V in the submicrometer regime. A full-swing version of the MBiCMOS gate (FS-MBiCMOS) is introduced. Simulations of 2-μm gates show FS-MBiCMOS/CMOS performance crossover voltages of 2.2 V     

Full-swing BiCMOS logic circuits with complementaryemitter-follower driver configuration

Various full-swing BiCMOS logic circuits with complementary emitter-follower driver configurations are described. The performance of the circuits is demonstrated in a 1.2 μm complementary BiCMOS technology with a 6 GHz n-p-n and a 2 GHz p-n-p transistor. For the basic circuit, gate delay (fan-in=2, fan-out=1) is 366 ps and driving capability is 288 ps/pF at 4 V. Delay-power tradeoffs that depend on characteristics of the clamping diode between two base nodes of the complementary emitter-follower driver, parasitic capacitances at the two base nodes, and a technique that can be used to achieve full swing have been identified for these circuits. These circuits show leverage over the conventional BiCMOS circuit for reduced power-supply voltages     

Differential BiCMOS logic circuits: fault characterization anddesign-for-testability

Merged Current Switch Logic (MCSL) and Differential Cascode Voltage Switch Logic (DCVSL) are two common structures for differential BiCMOS logic family, that have several potential applications in high-speed VLSI circuits. This paper studies the fault characterization of these BiCMOS circuits. The impact of each possible single defect on the behavior of the circuits is analyzed by simulation. A new class of faults which is unique to differential circuits is identified and its testability is assessed. We propose a design-for-testability method that facilitates testing of this class of faults. Two different realizations for this method are introduced. The impact of this circuit modification on the behavior of the circuit in normal mode is investigated