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1.
研究系统受到δ冲击时,考虑系统自然退化和冲击两个竞争性失效过程间具有相关性时,系统可靠性的建模问题。相关性一方面表现为冲击造成系统退化量的增加,另一方面表现为系统的自然退化程度对冲击结果的影响。假设系统因冲击而失效的过程是δ冲击过程,通过系统自然退化过程和冲击过程的分布函数,导出了系统的可靠度函数,建立了系统可靠度模型的一般形式,并给出一种特例的具体形式,最后利用文献中的具体参数进行仿真,以验证模型的正确性和有效性。  相似文献   

2.
This article develops reliability models for systems subject to two dependent competing failure processes, considering the correlation between additional damage size on degradation in soft failure process and stress magnitude of shock load in hard failure process, both of which are caused by the same kth random shock. The generalized correlative reliability assessment model based on copulas is proposed, which is then extended to three different shock patterns: (1) δ‐shock, (2) m‐shock, and (3) m‐run shocks. There are some statistical works to be introduced in reliability modeling, including data separation of total degradation amount, inferring the distribution of amount of aging continuous degradation at time t, and fitting copula to the specific correlation. The developed reliability models are demonstrated for an application example of a micro‐electro‐mechanical system.  相似文献   

3.
In this paper, a novel multistage reliability model is provided as systems are often divided into many stages according to system degradation characteristics. Multistage hard failure (caused by random shock) process (MHFP) and multistage soft failure (caused by random shock and continuous degradation) process (MSFP) are introduced to describe the competing failure processes, where either the MSFP or MHFP would break down the system. The shock processes impact the system in three ways: (1) fatal load shocks cause hard failure immediately in the hard failure process; (2) time shocks cause a hard failure threshold changing; (3) damage load shocks cause degradation level increasing in the soft failure process. In this paper, a density function dispersion method is carried out to address the multistage reliability model, and the effectiveness of the proposed models is demonstrated by reliability analysis with the one-stage model. Finally, the multistage model is applied to a case study, the degradation process is divided into three stages, and the hard failure threshold can be transmitted twice. The proposed model can be applied in other multistage situations, and the calculation method can satisfy the accuracy requirements.  相似文献   

4.
This paper presents an extension of reliability analysis of electronic devices with multiple competing failure modes involving performance aging degradation. The probability that a product fails on a specific mode is derived. Using this probability, the dominant failure mode on the product can be predicted. A practical example is presented to analyze an electronic device with two kinds of major failure modes–solder/Cu pad interface fracture (a catastrophic failure) and light intensity degradation (a degradation failure). Reliability modeling of an individual failure mode and device reliability analysis is presented and results are discussed. Copyright © 2003 John Wiley & Sons, Ltd.  相似文献   

5.
Traditional k-out-of-n models assume that the components are independent, while recent research studies assume that the components are dependent caused by global load-sharing characteristic. In this paper, we investigate the consecutive k-out-of-n systems with dependent components by local load-sharing characteristic. The work load and shock load on failed components will be equally shared by adjacent components, so the components tend to fail consecutively. Consequently, the components degradation processes may be diverse, since their degradation rate (dependent on work load) and abrupt degradation (dependent on shock load) become unequal because of local load-sharing effect. Furthermore, the system failure will be path-dependent on the failure sequences of components, which results in that the same system states may have different system failure probabilities. This new dependence makes the system reliability model more complex. In this work, an analytical model that can be solved numerically is derived to compute the reliability with this complex dependence. The developed model is demonstrated by a cable-strut system in the suspension bridge. The results show that the reliability decreases significantly when the new dependence is considered.  相似文献   

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